Ing.

Pavel Škarvada

Ph.D.

FEEC, UFYZ – assistant professor

+420 54114 6005
skarvada@feec.vutbr.cz

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Ing. Pavel Škarvada, Ph.D.

Publications

  • 2018

    HOLCMAN, V.; MACKŮ, R.; ŠKARVADA, P. Zařízení pro procesní analýzu hliníkových slitin. 2018. p. 0-10.
    Detail

    GAJDOŠ, A.; ŠKARVADA, P.; MACKŮ, R.; PAPEŽ, N.; ŠKVARENINA, Ľ.; SOBOLA, D. Isolation and optoelectronic characterization of Si solar cells microstructure defects. Journal of Physics: Conference Series, 2018, vol. 1124, no. 4, p. 1-6. ISSN: 1742-6596.
    Detail | WWW

    HOLCMAN, V.; ŠKARVADA, P.; MACKŮ, R. VÝROBA PROTOTYPU VOZÍTKA A NADSTAVBY. 2018. p. 1-8.
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    HOLCMAN, V.; MACKŮ, R.; ŠKARVADA, P. ZAŘÍZENÍ DITA (DENSITY INDEX THERMAL ANALYSIS). 2018. p. 1-21.
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    RUBEŠ, O.; TOFEL, P.; MACKŮ, R.; ŠKARVADA, P.; KŠICA, F.; HADAŠ, Z. Piezoelectric Micro-fiber Composite Structure for Sensing and Energy Harvesting Applications. In Proceedings of the 2018 18th International Conference on Mechatronics – Mechatronika (ME). 1. Brno: Brno University of Technolgy, 2018, 2018. p. 344-349. ISBN: 978-80-214-5543-6.
    Detail | WWW

    HOLCMAN, V.; TRČKA, T.; MACKŮ, R.; ŠKARVADA, P.; MAJZNER, J.; SEDLÁK, P. systému měření a verifikace rozměrů balíků kartonů. 2018. p. 1-25.
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    TALU, S.; MOROZOV, I.; SOBOLA, D.; ŠKARVADA, P. Multifractal Characterization of Butterfly Wings Scales. BULLETIN OF MATHEMATICAL BIOLOGY, 2018, vol. 80, no. 11, p. 2856-2870. ISSN: 0092-8240.
    Detail | WWW

    GAJDOŠ, A.; ŠKARVADA, P.; ŠKVARENINA, Ľ. Charakterizace a izolace defektů monokrystalických křemíkových solárních článků na mikroskopické úrovni. Elektrorevue - Internetový časopis (http://www.elektrorevue.cz), 2018, vol. 20, no. 1, p. 14-18. ISSN: 1213-1539.
    Detail | WWW

    ŠIK, O.; ŠKVARENINA, Ľ.; CAHA, O.; MORAVEC, P.; ŠKARVADA, P.; BELAS, E.; GRMELA, L. Determining the sub-surface damage of CdTe single crystals after lapping. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, vol. 29, no. 11, p. 9652-9662. ISSN: 0957-4522.
    Detail | WWW

    BAI, Y.; TOFEL, P.; HADAŠ, Z.; SMILEK, J.; LOŠÁK, P.; ŠKARVADA, P.; MACKŮ, R. Investigation of a cantilever structured piezoelectric energy harvester used for wearable devices with random vibration input. MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2018, vol. 106, no. 106, p. 303-318. ISSN: 0888-3270.
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    PAPEŽ, N.; SOBOLA, D.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Applied Surface Science, 2018, no. 461, p. 212-220. ISSN: 0169-4332.
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  • 2017

    SOBOLA, D.; PAPEŽ, N.; ŠKARVADA, P.; TOMÁNEK, P. Srovnání metod SEM a SPM pro charakterizaci solárních článků. Jemná mechanika a optika, 2017, no. 62, p. 81-83. ISSN: 0447-6441.
    Detail | WWW

    GAJDOŠ, A.; ŠKVARENINA, Ľ.; PAPEŽ, N.; ŠKARVADA, P.; MACKŮ, R. Advanced methods for localization and isolation of surface defects in monocrystalline silicon solar cells. Progress in Applied Surface, Interface and Thin Film Science - Solar Renewable Energy News 2017. Bratislava: Comenius University, 2017. p. 42-42. ISBN: 978-80-223-4411-1.
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    ČAIROVIĆ, D.; ZLÁMAL, M.; ŠTĚPÁNEK, P.; TRČKA, T.; ŠKARVADA, P.; MACKŮ, R. DETERMINATION OF SURFACE ROUGHNESS PARAMETERS BY OPTICAL PROFILOMETRY AND SAND PATCH TEST. Solid State Phenomena, 2017, no. 259, p. 15-20. ISSN: 1012-0394.
    Detail | WWW

    PAPEŽ, N.; SOBOLA, D.; ŠKARVADA, P.; ŠKVARENINA, Ľ.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Progress in Applied Surface, Interface and Thin Film Science - Solar Renewable Energy News 2017. Bratislava: Comenius University, 2017. p. 105-105. ISBN: 978-80-223-4411-1.
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    TRČKA, T.; MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.; BAROŇ, I.; STEMBERK, J. Field Measurement of Natural Electromagnetic Emissions near the Active Tectonic and Mass-Movement Fractures in Caves. Solid State Phenomena, 2017, vol. 258, no. 1, p. 460-464. ISSN: 1662-9779.
    Detail | WWW

    GAJDOŠ, A.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; MACKŮ, R. Microscale localization and isolation of light emitting imperfections in monocrystalline silicon solar cells. In Photonics, Devices, and Systems VII. Proceedings of SPIE. Bellingham, Washington 98227-0010 USA: SPIE, 2017. p. 1-6. ISBN: 9781510617025. ISSN: 0277-786X.
    Detail | WWW

    ŠKVARENINA, Ľ.; GAJDOŠ, A.; MACKŮ, R.; ŠKARVADA, P. Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence. In Photonics, Devices, and Systems VII. Proceedings of SPIE. Bellingham, Washington 98227-0010 USA: SPIE, 2017. p. 1-7. ISBN: 9781510617025. ISSN: 0277-786X.
    Detail | WWW

    ŠKVARENINA, Ľ.; MACKŮ, R.; ŠKARVADA, P.; GAJDOŠ, A.; ŠIKULA, J. Noise fluctuation changes related to edge deletion of thin-film Cu(In,Ga)Se2 solar cells. In 2017 International Conference on Noise and Fluctuations (ICNF). Proceedings of a meeting held 20-23 June 2017, Vilnius, Lithuania: Institute of Electrical and Electronics Engineers ( IEEE ), 2017. p. 1-4. ISBN: 978-1-5090-2761-3.
    Detail | WWW

    ŠKARVADA, P.; MACKŮ, R.; ŠKVARENINA, Ľ. Investigation of Defects at Cu(In,Ga)Se2 Flexible Solar Cells on Macroscopic and Microscopic Level and their Influence on Solar Cell Performance. Solid State Phenomena, 2017, vol. 258, no. 1, p. 469-473. ISSN: 1662-9779.
    Detail | WWW

  • 2016

    ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S. Multiscale experimental characterization of solar cell defects. In 20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. SPIE Proceedings. Bellingham, USA: SPIE, 2016. p. 101420U1 (101420U7 p.)ISBN: 9781510607330. ISSN: 0277-786X.
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    SOBOLA, D.; SADOVSKÝ, P.; ŠKARVADA, P.; TOMÁNEK, P. Analýza povrchového reliéfu solárních článků. Jemná mechanika a optika, 2016, vol. 11- 12, no. 61, p. 275-276. ISSN: 0447-6441.
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    SEDLÁK, P.; KUBERSKÝ, P.; ŠKARVADA, P.; HAMÁČEK, A.; SEDLÁKOVÁ, V.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J. Current-fluctuation measurements of amperometric gas sensors prepared by three different technology procedures. Metrology and Measurement Systems, 2016, vol. 23, no. 4, p. 531-543. ISSN: 2300-1941.
    Detail | WWW | Full text in the Digital Library

    ČAIROVIĆ, D.; ZLÁMAL, M.; ŠTĚPÁNEK, P.; TRČKA, T.; ŠKARVADA, P.; MACKŮ, R. DETERMINATION OF SURFACE ROUGHNESS PARAMETERS BY OPTICAL PROFILOMETRY AND SAND PATCH TEST. In 23. Betonářské dny (2016) Sborník. Litomyšl: 2016. p. 1-6. ISBN: 978-80-906097-6- 1.
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    ŠIK, O.; BÁBOR, P.; ŠKARVADA, P.; POTOČEK, M.; TRČKA, T.; GRMELA, L.; BELAS, E. Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties. Surface and Coatings Technology, 2016, vol. 306, no. A, p. 75-81. ISSN: 0257-8972.
    Detail | WWW

  • 2015

    TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L. Microscale localization and detection of defects in crystalline silicon solar cells. DGaO- PROCEEDINGS, 2015, vol. 2015, no. 2015, p. 1-2. ISSN: 1614- 8436.
    Detail | WWW

    SEDLÁK, P.; KUBERSKÝ, P.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J.; MACKŮ, R.; ŠKARVADA, P.; SEDLÁKOVÁ, V.; HAMÁČEK, A. Investigation of adsorption-desorption phenomenon by using current fluctuations of amperometric NO2 gas sensor. In Noise and Fluctuations (ICNF). IEEE, 2015. p. 1-4. ISBN: 978-1-4673-8335-6.
    Detail | WWW

    DALLAEVA, D.; TOMANEK, P.; PROKOPYEVA, E.; KASPAR, P.; GRMELA, L.; SKARVADA, P. AFM imaging of natural optical structures. Proceedings of SPIE, 2015, vol. 9442, no. 9442, p. 944209-1 (944209-8 p.)ISSN: 0277-786X.
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    ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P. SEM and AFM imaging of solar cells defects. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 1-6. ISSN: 0277-786X.
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    ŠKARVADA, P.; ŠKVARENINA, Ľ.; SOBOLA, D.; MACKŮ, R.; TOMÁNEK, P.; GRMELA, L. Multiscale characterization of solar cells. In Progress in Applied Surface, Interface and Thin- film Science 2015. Bratislava, Slovensko: Comenius University, 2015. p. 148-151. ISBN: 978-80-223-3975- 9.
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    DALLAEVA, D.; TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 94501O-1 (94501O-7 p.)ISSN: 0277-786X.
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  • 2014

    ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; SMITH, S.; GRMELA, L. A variety of microstructural defects in crystalline silicon solar cells. Applied Surface Science, 2014, vol. 312, no. 312, p. 50-56. ISSN: 0169-4332.
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    ŠICNER, J.; ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P. Study of the Influence of Structural Defects on Properties of Silicon Solar Cells. Key Engineering Materials (print), 2014, vol. 592-593, no. 1, p. 449-452. ISSN: 1013-9826.
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    TOFEL, P.; ŠKARVADA, P.; ŠIKULA, J.; CSÉFALVAY, G. Microstructure and Defects Evaluation of Varistors by Ultrasonic Waves in Low Frequency Range. Key Engineering Materials (print), 2014, vol. 465, no. 1, p. 688-691. ISSN: 1013- 9826.
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    DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science, 2014, vol. 312, no. 312, p. 81-86. ISSN: 0169-4332.
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    ŠKARVADA, P.; TOMÁNEK, P.; ŠICNER, J. Influence of localized structural defects on the pn junction properties. Key Engineering Materials (print), 2014, vol. 592-593, no. 1, p. 441-444. ISSN: 1013-9826.
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  • 2013

    DALLAEVA, D.; ŠKARVADA, P.; TOMÁNEK, P.; SMITH, S.; SAFARALIEV, G.; BILALOV, B.; GITIKCHIEV, M.; KARDASHOVA, G. Structural properties of Al2O3/AlN thin film prepared by magnetron sputtering of Al in HF- activated nitrogen plasma. Thin Solid Films, 2013, vol. 526, no. 526, p. 92-96. ISSN: 0040- 6090.
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    ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; DALLAEVA, D. Lokální optoelektronická diagnostika mikroskopických vad v solárním křemíkovém článku. Jemná mechanika a optika, 2013, vol. 2013, no. 3, p. 81-84. ISSN: 0447- 6441.
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    TOMÁNEK, P.; ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; SMITH, S. Cold field emission electrode as a local probe of proximal microscopes- Investigation of defects in monocrystalline silicon solar cells. WORLD JOURNAL OF ENGINEERING, 2013, vol. 10, no. 2, p. 119-124. ISSN: 1708- 5284.
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    ŠIK, O.; ŠKARVADA, P.; GRMELA, L.; ELHADIDY, H.; VONDRA, M.; ŠIKULA, J.; FRANC, J. Contact Quality Analysis and Noise Sources Determination of CdZnTe- Based High Energy Photon Detectors. Physica Scripta, 2013, vol. 85, no. 03, p. 1-5. ISSN: 0031- 8949.
    Detail | WWW

    ŠIK, O.; GRMELA, L.; ELHADIDY, H.; DĚDIČ, V.; ŠIKULA, J.; GRMELA, P.; FRANC, J.; ŠKARVADA, P.; HOLCMAN, V. Study of Electric Field Distribution and Low Frequency Noise of CdZnTe Radiation Detectors. Journal of Instrumentation, 2013, vol. 6, no. 23, p. 1-6. ISSN: 1748-0221.
    Detail | WWW

    ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; DALLAEVA, D. Microscopic optoelectronic defectoscopy of solar cells. EPJ Web of Conferences, 2013, vol. 48, no. 48, p. 00026. 1 (00026.4 p.)ISSN: 2100- 014X.
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    PROKOPYEVA, E.; TOMÁNEK, P.; KOCOVÁ, L.; PALAI-DANY, T.; BALÍK, Z.; ŠKARVADA, P.; GRMELA, L. Comparison of optical and electrical investigations of meat ageing. Proceedings of SPIE, 2013, vol. 8774, no. 8774, p. 84471L1 (84471L8 p.)ISSN: 0277-786X.
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    KLAMPÁR, M.; LIEDERMANN, K.; SPOHNER, M.; ŠKARVADA, P.; DALLAEVA, D.; KOBRTEK, J. Dielectric properties of epoxy resins with oxide nanofillers and their accelerated ageing. In IEEE Catalog Number CFP13EEI- USB. Ottawa, Ontario, Canada: Ottawa, Ontario, 2013. p. 159-164. ISBN: 978-1-4673-4739- 6.
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    ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; TOFEL, P.; ŠEVČÍK, M.; MACKŮ, R. Fluctuations of ultrasonic transducer vibration measurement. In 2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N- USB. Montpellier: 2013. p. Th-P-48- 1 (Th-P-48-4 p.)ISBN: 978-1-4799-0670- 3.
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    BOGATYREVA, N.; BARTLOVÁ, M.; AUBRECHT, V.; ŠKARVADA, P.; DALLAEVA, D. APPROXIMATE CALCULATIONS OF RADIATION EMISSION FROM SF6 ARC PLASMAS WITH CU VAPOURS. In Proceedings of XX Symposium on Physics of Switching Arc, Invited Lectures and Contributed Papers. Brno- Letohrad: VUT v Brně, OEZ Letohrad, 2013. p. 92-95. ISBN: 978-80-214-4753- 0.
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    ŠKARVADA, P.; TOMÁNEK, P.; ŠICNER, J. Influence of localized structure defects on the pn junction properties. Brno: VUTIUM, 2013. p. 203-203. ISBN: 978-80-214-4739- 4.
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    ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Optical and electrical detection and localization of solar cell defects on microscale. Proceedings of SPIE, 2013, vol. 8825, no. 8825, p. 8825071-88255077. ISSN: 0277- 786X.
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    ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L. Microstructure defects in silicon solar cells. In Proceedings of 8th Solid state surfaces and intefaces. 1. Bratislava: Comenius University Bratislava, 2013. p. 168-169. ISBN: 978-80-223-3501- 0.
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    DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; TALU, M.; GRMELA, L. AFM imaging and fractaí analysis of surface roughness of AlN epilayers deposited on saphire substrate. In Proceedings of 8th Solid State Surfaces and Interfaces. Bratislava: Comenius University, 2013. p. 33-34. ISBN: 978-80-223-3501- 0.
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    TOMÁNEK, P.; MACKŮ, R.; ŠKARVADA, P.; GRMELA, L. Optimalizace řešení měniče DC/ AC pro podmínky většího počtu DC vstupů. Brno: UFYZ FEKT VUT, 2013. p. 1-6.
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    TOMÁNEK, P.; MACKŮ, R.; ŠKARVADA, P.; GRMELA, L. Kalibrační přístroj regulačních systémů digitálně řízených pohonů. Brno: UFYZ FEKT VUT, 2013. p. 1-6.
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  • 2012

    TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S. Local investigation of defects in monocrystalline silicon solar cells. Conference Record of the IEEE Photovoltaic Specialists Conference, 2012, vol. 2012, no. 1, p. 1686-1690. ISSN: 0160- 8371.
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    ŠKARVADA, P.; TOMÁNEK, P.; DALLAEVA, D. Solar Cell Structure Defects and Cracks. In Fracture Mechanics for Durability, Reliability and Safety. Kazaň: 2012. p. 507-514. ISBN: 978-5-905576-18- 8.
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    DALLAEVA, D.; ŠKARVADA, P.; ARKHIPOV, A. Mezhdisciplinarnyj podhod k obucheniju inzhenerno- tehnicheskogo personala. In Materials of III All Russian conference: Innovation, science,education: ways of integrations, problems, contradictions. First. Derbent: FGBOU VPO DGTU, 2012. p. 201-204. ISBN: 5-230-12933- 6.
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    TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; DALLAEVA, D. Optoelectronic diagnostics of defects in solar cell structures. In Optica and Measurement 2012. Prague: Institute of plasma Physics, 2012. p. 137-140. ISBN: 978-80-87026-02- 1.
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    ŠKARVADA, P.; TOFEL, P.; TOMÁNEK, P. Ultrasonic transducer peak-to- peak optical measurement. Advances in Electrical and Electronic Engineering - intenetový časopis, (http://advances.utc.sk), 2012, vol. 10, no. 2, p. 125-129. ISSN: 1804- 3119.
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    ŠKARVADA, P.; TOMÁNEK, P. Microholes on the silicon solar cell surface. In New trends in physics 2012. Brno: Litera Brno, 2012. p. 165-168. ISBN: 978-80-214-4594- 9.
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    GRMELA, L.; ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R.; SMITH, S. Local investigation of thermal dependence of light emission from reverse- biased monocrystalline silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, vol. 96, no. 1, p. 108-111. ISSN: 0927- 0248.
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    ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P. Solar cell shunt characterization via microscale light induced current. In IMAPS CS International Conference 2011 Proceedings. 1. Brno: VUT Brno, 2012. p. 95-99. ISBN: 978-80-214-4303- 7.
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  • 2011

    ŠKARVADA, P.; TOMÁNEK, P.; PALAI-DANY, T. Artificial defects of solar cells. ElectroScope - http://www.electroscope.zcu. cz, 2011, vol. 2011, no. 2, p. 33-37. ISSN: 1802- 4564.
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    ŠKARVADA, P.; GRMELA, L.; TOMÁNEK, P. Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency. Key Engineering Materials, 2011, vol. 465, no. 1, p. 239-242. ISSN: 1013- 9826.
    Detail

    GRMELA, L.; ŠKARVADA, P.; MACKŮ, R.; TOMÁNEK, P. Near- field Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Inventi Rapid: Energy & Power, 2011, vol. 2011, no. 2, p. 1-4. ISSN: 2229- 7774.
    Detail

    ŠKARVADA, P. Measurement induced solar cell defect characterization. In proceedings of the 17th conference student eeict 2011 vol. 3. Brno: Novpress, 2011. p. 386-390. ISBN: 978-80-214-4273- 3.
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    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Non-destructive Characterization of Micro- sized Defects in the Solar Cell Structure. Key Engineering Materials, 2011, vol. 465, no. 1, p. 314-317. ISSN: 1013- 9826.
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    ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Influence of laser cutting on p- n junction behavior of solar cell. VDI Berichte, 2011, vol. 2156, no. 2156, p. 291-296. ISSN: 0083- 5560.
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    ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Local measurement of solar cell emission characteristics. Proceedings of SPIE, 2011, vol. 8036, no. 8306, p. 1H1 (1H6 p.)ISSN: 0277- 786X.
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    ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P. Microscale comparison of solar cell recombination centers. ElectroScope - http://www.electroscope.zcu. cz, 2011, vol. 2011, no. 4, p. 25-28. ISSN: 1802- 4564.
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  • 2010

    TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; GRMELA, L. Detection and localization of defects in monocrystalline silicon solar cell. Advances in Optical Technologies, 2010, vol. 2010, no. 805325, p. 8053251-8053255. ISSN: 1687-6393.
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    ŠKARVADA, P.; TOMANEK, P.; MACKŮ, R. Characterization of Si Solar Cells Imperfections in the Near- Field. In 25th European Photovoltaic Solar Energy Conference (id 18618). Valencia: WIP - Renewable Energies, 2010. p. 351-354. ISBN: 3-936338-26- 4.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency. Materials structure and micromechanics of fracture. Brno: Vutium, 2010. p. 160-160. ISBN: 978-80-214-4112- 5.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P. Reverse- biased solar cell light emission thermal dependency. In Electronic Devices and Systems EDS10. Brno: Novpress, 2010. p. 304-307. ISBN: 978-80-214-4138- 5.
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    ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R. Light emission from silicon solar cells as characterization technique. In 2010 9th International Conference on Environment and Electrical Engineering. Wroclaw: Reprotechnika Wroclaw, 2010. p. 97-100. ISBN: 978-1-4244-5371- 9.
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    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Non-destructive Characterization of Micro- sized Defects in the Solar Cell Structure. Materials Structure & Micromechanics of Fracture - Abstract Booklet. 1. Brno: Vutium, 2010. p. 169-169. ISBN: 978-80-214-4112- 5.
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    TOMÁNEK, P.; ŠKARVADA, P. Power efficiency of tapered probe and its influence on resolution in Scanning near- field optical microscopy. Acta Electrotechnica et Informatica, 2010, vol. 10, no. 3, p. 47-51. ISSN: 1335- 8243.
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    ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Microscale localization of low light emitting spots in reversed- biased silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2010, vol. 94, no. 12, p. 2358-2361. ISSN: 0927- 0248.
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    ŠKARVADA, P. Low radiant flux detection system for solar cell electroluminescence characterization. In proceedings of the 16th conference student eeict 2010 vol. 5. Brno: Novpress, 2010. p. 129-133. ISBN: 978-80-214-4080- 7.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P. Lokální vyzařování ze závěrně polarizovaných solárních článků. Jemná mechanika a optika, 2010, vol. 55, no. 1, p. 18-20. ISSN: 0447- 6441.
    Detail

    TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Local optical and electric characteristics of solar cells. In Ninth International Conference on Correlation Optics. Proceedings of SPIE. Bellingham, USA: SPIE, 2010. p. 73880L1 (73880L9 p.)ISBN: 978-0-8194-7671- 5. ISSN: 0277-786X.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Innovative electric model of n+ p silicon solar cells. In Proceedings of 24rd European Photovoltaic Solar Energy Conference. WIP- Renewable Energies, 2010. p. 439-443. ISBN: 3-936338-24- 8.
    Detail

  • 2009

    TOMÁNEK, P.; ŠKARVADA, P. Loss in the near- field optical microscopy due to the tapered probe. In Proceedings Physics of Materials 09. Košice, Slovensko: Technical University Košice, 2009. p. 119-122. ISBN: 978-80-8086-122- 3.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P. Charakterizace solárních článků s využitím vyzařování ze závěrně polarizovaných pn přechodů. In Sborník příspěvků konference Králíky 2009. Brno: VUT v Brně FEKT, 2009. p. 269-272. ISBN: 978-80-214-3938- 2.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Near- field photoelectric measurement of Si solar cells. In 24th European Photovoltaic Solar Energy Conference Proceedings. Hamburg, Germany: 2009. p. 480-483. ISBN: 3-936338-25- 6.
    Detail

    ŠKARVADA, P. Advanced method of Scanning probe microscopy image restoration. In Proceedings of the 15th conference Student EEICT 2004 volume 3. Brno: NOVPRESS, 2009. p. 166-170. ISBN: 978-80-214-3869- 9.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.; RAŠKA, M.; SADOVSKÝ, P. Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy. In Noise and Fluctuations, ICNF 2009. AIP conference proceedings. U.S.A.: American Institute of Physics, 2009. p. 145-148. ISBN: 978-0-7354-0665- 0. ISSN: 0094- 243X.
    Detail

    ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.; RAŠKA, M. Noise of Reverse Biased Solar Cells. In Noise and Fluctuations ICNF2009. AIP conference proceedings. U.S.A.: American Institute of Physics, 2009. p. 391-394. ISBN: 978-0-7354-0665- 0. ISSN: 0094- 243X.
    Detail

  • 2008

    ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Elektrická odezva solárních článků v mikroskopickém měřítku. In Sborník příspěvků ze 3. České fotovoltaické konerence. Rožnov pod Radhoštěm: Czech RE Agency, 2008. p. 132-136. ISBN: 978-80-254-3528- 1.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Nedestruktivní testování křemíkových solárních článků založené na šumové spektroskopii. In Sborník příspěvků ze 3. České fotovoltaické konference. Rožnov pod Radhoštěm: Czech RE Agency, 2008. p. 123-127. ISBN: 978-80-254-3528- 1.
    Detail

    ŠKARVADA, P. Solar cell surface local reflaction and pn junction area measurement. In Proceedings of the 14th conference Student EEICT 2008 volume 4. Brno: Ing. Zdeněk Novotný CSc., 2008. p. 317-321. ISBN: 978-80-214-3617- 6.
    Detail

    GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS: Mn nanoparticles. In Materials Structure and Micromechanics of Fracture V. 567- 568. Zurich, Switzerland: ttp Trans Tech Publications, 2008. p. 421-424. ISBN: 978-0-87849-469- 9.
    Detail

    ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P. Nanooptics of locally induced photocurrent in monocrystalline Si solar cells. In Photonics, Devices and Systems - Proceedings of SPIE vol. 7138. Proceedings of SPIE. Bellingham, USA: SPIE, 2008. p. 2901-2906. ISBN: 978-0-8194-7379- 0. ISSN: 0277-786X.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Charakterizace lokálních defektů solárních článků. In Non- destructive testing in engineering practice. -. Brno: Brno University of Technology, 2008. p. 74-77. ISBN: 978-80-7204-610- 2.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P. Local light to electric energy conversion measurement of silicon solar cells. In Reliability and Life-time Prediction, Conference Proceedings. Hungary, Budapest: Zsolt Illyefalvi-Vitéz, Bálint Balogh, 2008. p. 101-104. ISBN: 978-963-06-4915- 5.
    Detail

    MACKŮ, R.; ŠKARVADA, P.; KOKTAVÝ, P. On the determination of silicon solar cell properties via capacitance characteristics. In Proceedings of 23rd European Photovoltaic Solar Energy Conference. Valencia, Spain: WIP- Renewable Energies, 2008. p. 364-369. ISBN: 3-936338-24- 8.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Advanced non- destructive diagnostics of monocrystalline silicon solar cells. WSEAS Transactions on Electronics, 2008, vol. 4, no. 9, p. 192-197. ISSN: 1109- 9445.
    Detail

    ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P. Nanooptics of locally induced photocurrent in Si solar cells. In Photonics Prague 2008. Prague: Zeithamlová Milena, Ing. - Agentura Action M, 2008. p. 96-97. ISBN: 978-80-86742-25- 0.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Study of local properties of silicon solar cells. In Proceeding of 23rd European Photovoltaic Solar Energy Conference. Valencia Spain: WIP - Renewable Energies, 2008. p. 1644-1647. ISBN: 3-936338-24- 8.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Study of solar cells I- V chracteristics behaviour in wide range of temperature. In Electronic Devices and Systems EDS08. Brno: Brno University of Technology, 2008. p. 120-125. ISBN: 978-80-214-3717- 3.
    Detail

  • 2007

    ŠKARVADA, P.; MACKŮ, R. SNOM fotoluminiscence a topografické měření kvantových teček InAs/ GaAs. In Elektrotechnika a informatika 2007. Plzeň: Západočeská universita, 2007. p. 105-108. ISBN: 978-80-7043-572- 4.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Skenování materiálů lokální optickou sondou v blízkém poli. In 5th Workshop NDT 2007. Non- destructive testing in engineering practice. Brno: Brno University of Technology, 2007. p. 150-154. ISBN: 978-80-7204-549- 5.
    Detail

    GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS: Mn nanoparticles. Materials Science Forum, 2007, vol. 2007, no. 567, p. 241-244. ISSN: 0255- 5476.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Šum mikroplazmatu solárních článků. In 5th Workshop NDT 2007, Non- destructive testing in engineering practise. Brno: Brno University of Technology, 2007. p. 71-75. ISBN: 978-80-7204-549- 5.
    Detail

    ŠKARVADA, P. Scanning near- field optical microscopy. In New Trends in Physics. Brno: Ing. Zdeněk Novotný Csc., 2007. p. 274-277. ISBN: 978-80-7355-078- 3.
    Detail

    MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P. Metodika měření šumu solárních článků. In Elektronika a informatika 2007. -. Plzeň: Západočeská univerzita v Plzni, 2007. p. 45-48. ISBN: 978-80-7043-572- 4.
    Detail

    TOMÁNEK, P.; GRMELA, L.; ŠKARVADA, P. Optical fiber Bragg grating used in the sensing of surface plasmon resonance. In Optomechatronic Sensors and Instrumentation III, Proceedings of SPIE, Vol. 6716. Proceedings of SPIE. Bellingham, USA: SPIE, 2007. p. 215-223. ISBN: 978-0-8194-6864- 2. ISSN: 0277-786X.
    Detail

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