Publication detail

Microscale localization of low light emitting spots in reversed-biased silicon solar cells

ŠKARVADA, P. TOMÁNEK, P. GRMELA, L. SMITH, S.

Original Title

Microscale localization of low light emitting spots in reversed-biased silicon solar cells

Czech Title

Mikrometrická lokalizace slabě svítících skvrn v solárních článcích v závěrném směru

English Title

Microscale localization of low light emitting spots in reversed-biased silicon solar cells

Type

journal article

Language

en

Original Abstract

We present the results of an investigation of the sub-micron irregularities in a monocrystalline silicon solar cell structure utilizing scanning near-field microscopy. The experiments rely on the fact that silicon solar cells under reverse bias exhibit micron-scale low-light emitting centers. A novel method allowing simultaneous localization and measurement of this light on the microscale is presented. The method allows the characterization of these irregularities with high spatial resolution.

Czech abstract

V článku jsou prezentovány výsledky zkoumání nepravidelností subvlnových rozměrů v monokrystalických strukturách solárních článků při využití SNOM. Experimenty jsou založeny na faktu, že křemíkové solární články v závěrném směru vykazují mikroskopické slebě svítící body. Prezentujem novou metodu, která umožňuje lokalizaci a měření tohoto světla v mikroměřítku a umožňuje též charakterizace těchto nepravidelností s vysokým prostorovým rozlišením.

English abstract

We present the results of an investigation of the sub-micron irregularities in a monocrystalline silicon solar cell structure utilizing scanning near-field microscopy. The experiments rely on the fact that silicon solar cells under reverse bias exhibit micron-scale low-light emitting centers. A novel method allowing simultaneous localization and measurement of this light on the microscale is presented. The method allows the characterization of these irregularities with high spatial resolution.

Keywords

solar cell, defect, light emission, scanning probe microscope, microscale, localization

RIV year

2010

Released

09.09.2010

Publisher

Elsevier

Location

North-Holland

Pages from

2358

Pages to

2361

Pages count

4

BibTex


@article{BUT49808,
  author="Pavel {Škarvada} and Pavel {Tománek} and Lubomír {Grmela} and Steve J. {Smith}",
  title="Microscale localization of low light emitting spots in reversed-biased silicon solar cells",
  annote="We present the results of an investigation of the sub-micron irregularities in a monocrystalline silicon solar cell structure utilizing scanning near-field microscopy. The experiments rely on the fact that silicon solar cells under reverse bias exhibit micron-scale low-light emitting centers. A novel method allowing simultaneous localization and measurement of this light on the microscale is presented. The method allows the characterization of these irregularities with high spatial resolution.",
  address="Elsevier",
  chapter="49808",
  institution="Elsevier",
  journal="SOLAR ENERGY MATERIALS AND SOLAR CELLS",
  number="12",
  volume="94",
  year="2010",
  month="september",
  pages="2358--2361",
  publisher="Elsevier",
  type="journal article"
}