Publication detail

Microscale localization and detection of defects in crystalline silicon solar cells

TOMÁNEK, P. ŠKARVADA, P. MACKŮ, R. SOBOLA, D. BRÜSTLOVÁ, J. GRMELA, L.

Original Title

Microscale localization and detection of defects in crystalline silicon solar cells

Czech Title

Mikroskopická lokalizace a detekce defektů v křemíkovém solárním článku

English Title

Microscale localization and detection of defects in crystalline silicon solar cells

Type

journal article

Language

en

Original Abstract

Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.

Czech abstract

Křemík zůstává nejlepe prostudovaný materiál, ať již jsem o jeho objemové či tenkovrstvové konfigurace. Solární článek z momokrystalického křemíku je photoelektrické zařízení s nejvyšší účinností, ale obsahuje celou řadu nepatrných defektů, které snižují jeho účinnost. Článek přináší novou metodu, které kombinuje elektrické a optické měření.

English abstract

Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.

Keywords

defect, silicon, solar cell, localization, detection

RIV year

2015

Released

17.08.2015

Publisher

DGaO

Location

Erlangen, Německo

Pages from

1

Pages to

2

Pages count

2

URL

BibTex


@article{BUT116796,
  author="Pavel {Tománek} and Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Jitka {Brüstlová} and Lubomír {Grmela}",
  title="Microscale localization and detection of defects in crystalline silicon solar cells",
  annote="Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.",
  address="DGaO",
  chapter="116796",
  howpublished="online",
  institution="DGaO",
  number="2015",
  volume="2015",
  year="2015",
  month="august",
  pages="1--2",
  publisher="DGaO",
  type="journal article"
}