Publication detail

Multiscale experimental characterization of solar cell defects

ŠKARVADA, P. ŠKVARENINA, Ľ. TOMÁNEK, P. SOBOLA, D. MACKŮ, R. BRÜSTLOVÁ, J. GRMELA, L. SMITH, S.

Original Title

Multiscale experimental characterization of solar cell defects

English Title

Multiscale experimental characterization of solar cell defects

Type

conference paper

Language

en

Original Abstract

The search for alternative sources of renewable energy, including novel photovoltaics structures, is one of the principal tasks of 21th century development. In the field of photovoltaics three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure features are used and studied. Due to the diversity of these structures, their complex study requires the multiscale interpretations bridging time and length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but more and more applied to experimental characterization. We investigate multiscale aspects of electrical, optical and material properties of solar cells under illumination and in dark conditions when an external bias is applied. We present the results of a research of the micron and sub-micron defects in a crystalline solar cell structure utilizing scanning probe microscopy and electric noise measurement.

English abstract

The search for alternative sources of renewable energy, including novel photovoltaics structures, is one of the principal tasks of 21th century development. In the field of photovoltaics three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure features are used and studied. Due to the diversity of these structures, their complex study requires the multiscale interpretations bridging time and length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but more and more applied to experimental characterization. We investigate multiscale aspects of electrical, optical and material properties of solar cells under illumination and in dark conditions when an external bias is applied. We present the results of a research of the micron and sub-micron defects in a crystalline solar cell structure utilizing scanning probe microscopy and electric noise measurement.

Keywords

solar cell, defect, noise, multiscale, detection, localization

Released

24.12.2016

Publisher

SPIE

Location

Bellingham, USA

ISBN

9781510607330

Book

20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics

Edition

SPIE Proceedings

Edition number

10142

Pages from

101420U1

Pages to

101420U7

Pages count

7

Documents

BibTex


@inproceedings{BUT130701,
  author="Pavel {Škarvada} and Ľubomír {Škvarenina} and Pavel {Tománek} and Dinara {Sobola} and Robert {Macků} and Jitka {Brüstlová} and Lubomír {Grmela} and Steve J. {Smith}",
  title="Multiscale experimental characterization of solar cell defects",
  annote="The search for alternative sources of renewable energy, including novel photovoltaics structures, is one of the principal tasks of 21th century development. In the field of photovoltaics three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure features are used and studied. Due to the diversity of these structures, their complex study requires the multiscale interpretations bridging time and length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but more and more applied to experimental characterization.  We investigate multiscale aspects of electrical, optical and material properties of solar cells under illumination and in dark conditions when an external bias is applied. We present the results of a research of the micron and sub-micron defects in a crystalline solar cell structure utilizing scanning probe microscopy and electric noise measurement.",
  address="SPIE",
  booktitle="20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics",
  chapter="130701",
  doi="10.1117/12.2259884",
  edition="SPIE Proceedings",
  howpublished="online",
  institution="SPIE",
  number="10142",
  year="2016",
  month="december",
  pages="101420U1--101420U7",
  publisher="SPIE",
  type="conference paper"
}