Publication detail

A variety of microstructural defects in crystalline silicon solar cells

ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P. MACKŮ, R. ŠICNER, J. VONDRA, M. DALLAEVA, D. SMITH, S. GRMELA, L.

Original Title

A variety of microstructural defects in crystalline silicon solar cells

Czech Title

Rozmanité mikrrostrukturní defekty v solárních článcích s krystalickým křemíkem

English Title

A variety of microstructural defects in crystalline silicon solar cells

Type

journal article

Language

en

Original Abstract

The performance and lifetime of solar cells critically depends on bulk and surface defects. To improve performance of solar cells, localization and characterization of defects on the microscale is an important issue. This paper describes a variety of microstructural defects in crystalline silicon solar cells which appear during the cell processing steps. The set of defects have been investigated and localized using visible light emission under reversed bias voltage. A light beam induced photocurrent method allows localization of defects having impact on the sample current-voltage plot and reversed bias light emission characteristics. These are shown together with the micrographs of defective surface areas. As a result, particular defects which induce nonlinearity and local breakdown in the current-voltage plot were identified in tested solar cell structures. Furthermore, measurements at various temperatures allows to identify the breakdown mechanism of the investigated defects. An interesting result of the investigation is that the majority of defects are associated with surface inhomogeneities, but not all surface inhomogeneities act as defects.

Czech abstract

Výkonnost a životnost solárních článků závisí kriticky na povrchových i objemových defektech. Pro lepší výkonnost je nutné provést lokalizaci a charakterizaci defektů v mikroměřítku. článek přináší přehled mikrodefektů, které vznikají v průběhu výroby článků. Tyto defekty byly zkoumány pomocí vyzařování článků zapojených v reverzním režimu. Indukovaný fotoproud umožní lokalizaci defektů. Defekty jsou znázorněny spolu s mikrografy defektní oblasti. Jako výsledek byly identifikovány defekty, které způsobují nelinearity ve V-A charakteristice a lokální průrazy. Teplotní měření umožuje identifikovat mechanismus průrazu v těchto defektech. Zajímavým výsledkem je, že většina deefektů je sdružena s nehomogenitami povrchů, ale ne všechny povrchové nehomogenity se chovají jako defekt

English abstract

The performance and lifetime of solar cells critically depends on bulk and surface defects. To improve performance of solar cells, localization and characterization of defects on the microscale is an important issue. This paper describes a variety of microstructural defects in crystalline silicon solar cells which appear during the cell processing steps. The set of defects have been investigated and localized using visible light emission under reversed bias voltage. A light beam induced photocurrent method allows localization of defects having impact on the sample current-voltage plot and reversed bias light emission characteristics. These are shown together with the micrographs of defective surface areas. As a result, particular defects which induce nonlinearity and local breakdown in the current-voltage plot were identified in tested solar cell structures. Furthermore, measurements at various temperatures allows to identify the breakdown mechanism of the investigated defects. An interesting result of the investigation is that the majority of defects are associated with surface inhomogeneities, but not all surface inhomogeneities act as defects.

Keywords

Solar cell, silicon, microstructure defect, light emission, reverse bias, measurement

RIV year

2014

Released

01.09.2014

Publisher

Elsevier

Pages from

50

Pages to

56

Pages count

7

BibTex


@article{BUT107704,
  author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Robert {Macků} and Jiří {Šicner} and Marek {Vondra} and Dinara {Sobola} and Steve J. {Smith} and Lubomír {Grmela}",
  title="A variety of microstructural defects in crystalline silicon solar cells",
  annote="The performance and lifetime of solar cells critically depends on bulk and surface  defects. To improve performance of solar cells, localization and characterization of defects on  the microscale is an important issue. This paper describes a variety of microstructural defects  in crystalline silicon solar cells which appear during the cell processing steps. The set of  defects have been investigated and localized using visible light emission under reversed bias  voltage. A light beam induced  photocurrent method allows localization of defects having  impact on the sample current-voltage plot and reversed bias light emission characteristics. 
These are shown together with the micrographs of defective surface areas. As a result, particular defects which induce nonlinearity and local breakdown in the current-voltage plot  were identified in tested solar cell structures. Furthermore,  measurements at various  temperatures allows to identify the breakdown mechanism of the investigated defects. An  interesting result of the investigation is that the majority of defects are associated with surface  inhomogeneities, but not all surface inhomogeneities act as defects.",
  address="Elsevier",
  chapter="107704",
  doi="10.1016/j.apsusc.2014.05.064",
  institution="Elsevier",
  number="312",
  volume="312",
  year="2014",
  month="september",
  pages="50--56",
  publisher="Elsevier",
  type="journal article"
}