Publication detail

Microholes on the silicon solar cell surface

ŠKARVADA, P. TOMÁNEK, P.

Original Title

Microholes on the silicon solar cell surface

Type

conference paper

Language

English

Original Abstract

Local defects of optoelectronic devices with pn junction affect parameters of whole devices and their quality. For the defects localization purposes the emission of photons from reverse biased devices can be used. Actual results turns out, that those particular light emitting centers can have different physical nature. Some of these defects have indisputable connection with surface morphology, however some not, which makes localization more difficult. In this paper only microholes are investigated. Microscopic localization is not elementary due to small defect size (in submicron range) and low emission intensity. Experimental results are shown and discussed.

Keywords

Solar cell defects, microscopy characterization

Authors

ŠKARVADA, P.; TOMÁNEK, P.

RIV year

2012

Released

12. 10. 2012

Publisher

Litera Brno

Location

Brno

ISBN

978-80-214-4594-9

Book

New trends in physics 2012

Edition number

I

Pages from

165

Pages to

168

Pages count

4

BibTex

@inproceedings{BUT94823,
  author="Pavel {Škarvada} and Pavel {Tománek}",
  title="Microholes on the silicon solar cell surface",
  booktitle="New trends in physics 2012",
  year="2012",
  number="I",
  pages="165--168",
  publisher="Litera Brno",
  address="Brno",
  isbn="978-80-214-4594-9"
}