Publication detail

Optoelectronic diagnostics of defects in solar cell structures

TOMÁNEK, P. ŠKARVADA, P. GRMELA, L. DALLAEVA, D.

Original Title

Optoelectronic diagnostics of defects in solar cell structures

Czech Title

Optoelektronická diagnostika defektů v solárních článcích

English Title

Optoelectronic diagnostics of defects in solar cell structures

Type

conference paper

Language

en

Original Abstract

Scanning proximal microscopy is successfully used for micro- or nanoscale diagnostics of defects in monocrystalline silicon solar cells. The elaborated method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current. To prove the feasibility of this method, we have chosen one bulk and one edge defect within the sample, which emitted light under low reverse-biased voltage.

Czech abstract

Skenovací mikroskopie je s úspěchem použita pro mikro a nano diagnostiku defektů v monokrystalickém křemíkovém solárním článku. Navržená metoda kombinuje tři různá měření - elektrický šum, lokální topografii a lokálně indukovaný fotoproud. Pro potvrzení měření jsme zvolili jeden oblemový a jeden hranový defekt, které vyzařují světlo při závěrném napětí.

English abstract

Scanning proximal microscopy is successfully used for micro- or nanoscale diagnostics of defects in monocrystalline silicon solar cells. The elaborated method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current. To prove the feasibility of this method, we have chosen one bulk and one edge defect within the sample, which emitted light under low reverse-biased voltage.

Keywords

monocrystalline silicon, solar cell, defect, diagnsitcis, local measurement

RIV year

2012

Released

16.10.2012

Publisher

Institute of plasma Physics

Location

Prague

ISBN

978-80-87026-02-1

Book

Optica and Measurement 2012

Pages from

137

Pages to

140

Pages count

4

BibTex


@inproceedings{BUT94572,
  author="Pavel {Tománek} and Pavel {Škarvada} and Lubomír {Grmela} and Dinara {Sobola}",
  title="Optoelectronic diagnostics of defects in solar cell structures",
  annote="Scanning proximal microscopy is successfully used for micro- or nanoscale diagnostics of defects in monocrystalline silicon solar cells. The elaborated method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current. To prove the feasibility of this method, we have chosen one bulk and one edge defect within the sample, which emitted light under low reverse-biased voltage.",
  address="Institute of plasma Physics",
  booktitle="Optica and Measurement 2012",
  chapter="94572",
  howpublished="print",
  institution="Institute of plasma Physics",
  year="2012",
  month="october",
  pages="137--140",
  publisher="Institute of plasma Physics",
  type="conference paper"
}