Publication detail

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

ŠKARVADA, P. GRMELA, L. TOMÁNEK, P.

Original Title

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

Czech Title

Stanovení lokální kvality monokristalických solárních článků

English Title

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

Type

journal article

Language

en

Original Abstract

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

Czech abstract

Solární články jsou používány ke konverzi slunčeního světla na elektrickou energii. Defekty nebo nedokonalosti křemíkových solárních článků snižují výtěžek světlo-proud a mají tedy vliv na jejich účinnost. Tyto defekty jsou v křemíkových strukturách detekovány s využitím elektrických měření. Teplotní závislost průrazného napětí defektu je pozitivní a defekt může být odhalen pozorován jako povrchová nehomogenita. S využitím rastrovacího optického mikroskopu se sondou v blízkém poli lze lokálně excitovat solární článek a měřit jeho lokální proudovou odezvu.

English abstract

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

Keywords

Near-field optical measurement, solar cell, quantum efficiency

RIV year

2011

Released

10.01.2011

Publisher

Trans Tech Publications

Location

Switzerland

Pages from

239

Pages to

242

Pages count

4

BibTex


@article{BUT49942,
  author="Pavel {Škarvada} and Lubomír {Grmela} and Pavel {Tománek}",
  title="Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency",
  annote="Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.",
  address="Trans Tech Publications",
  chapter="49942",
  institution="Trans Tech Publications",
  number="1",
  volume="465",
  year="2011",
  month="january",
  pages="239--242",
  publisher="Trans Tech Publications",
  type="journal article"
}