Publication detail

Nanooptics of locally induced photocurrent in monocrystalline Si solar cells

ŠKARVADA, P. GRMELA, L. ABUETWIRAT, I. TOMÁNEK, P.

Original Title

Nanooptics of locally induced photocurrent in monocrystalline Si solar cells

Czech Title

Nanooptika lokálně indukovaného fotoproudu v monokrystalických Si solárních článcích

English Title

Nanooptics of locally induced photocurrent in monocrystalline Si solar cells

Type

conference paper

Language

en

Original Abstract

This paper presents the results of our experimental study of high resolution map of induced photocurrent in monocrystalline silicon solar cells. Photovoltaic solar cells are evaluated by Near-field Optical Beam Induced photocurrent (NOBIC), as well as by Scanning Near-field Optical Microscope (SNOM) topography and reflection. The correlation between reflection and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM and NOBIC represent the coupling of very useful methods to provide a non-destructive local characterization on silicon semiconductor solar cells.

Czech abstract

Článek přináší výsledky experimentální studii detailního mapování s vysokým rozlišením lokálně indukovaného fotoproudu v monokrystalických solárních článcích. Fotovoltaické články jsou studovány pomocí metody NOBIC (fotoproud indukovaný pomocí blízkého optického pole) a jejich odrazivost a topografie je studována pomocí SNOM mikroskopu. Vysoká korelace odrazivosti a transportních charakteristik ukazují na možnosti tohoto diagnostického nástroje. Tedy SNOM a NOBIC je spojením velmi účinných metod, které umožní nedestruktivní charakterizaci křemíkových solárních článků.

English abstract

This paper presents the results of our experimental study of high resolution map of induced photocurrent in monocrystalline silicon solar cells. Photovoltaic solar cells are evaluated by Near-field Optical Beam Induced photocurrent (NOBIC), as well as by Scanning Near-field Optical Microscope (SNOM) topography and reflection. The correlation between reflection and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM and NOBIC represent the coupling of very useful methods to provide a non-destructive local characterization on silicon semiconductor solar cells.

Keywords

monocrystalline Si, solar cell, locally induced photocurrent

RIV year

2008

Released

17.11.2008

Publisher

SPIE

Location

Bellingham, USA

ISBN

978-0-8194-7379-0

Book

Photonics, Devices and Systems - Proceedings of SPIE vol.7138

Edition number

7138

Pages from

2901

Pages to

2906

Pages count

6

BibTex


@inproceedings{BUT29806,
  author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}",
  title="Nanooptics of locally induced photocurrent in monocrystalline Si solar cells",
  annote="This paper presents the results of our experimental study of high resolution map of induced photocurrent in monocrystalline silicon solar cells. Photovoltaic solar cells are evaluated by Near-field Optical Beam Induced photocurrent (NOBIC), as well as by Scanning Near-field Optical Microscope (SNOM) topography and reflection.  The correlation between reflection and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM and NOBIC represent the coupling of very useful methods to provide a non-destructive local characterization on silicon semiconductor solar cells.",
  address="SPIE",
  booktitle="Photonics, Devices and Systems - Proceedings of SPIE vol.7138",
  chapter="29806",
  howpublished="print",
  institution="SPIE",
  journal="Proceedings of SPIE",
  number="7138",
  year="2008",
  month="november",
  pages="2901--2906",
  publisher="SPIE",
  type="conference paper"
}