Publication detail

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

GRMELA, L. ŠKARVADA, P. TOMÁNEK, P. MACKŮ, R. SMITH, S.

Original Title

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

English Title

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

Type

journal article

Language

en

Original Abstract

The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.

English abstract

The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.

Keywords

Si solar cell, thermal characteristics, local measurement, high resolution

RIV year

2012

Released

22.01.2012

Publisher

Elsevier

Location

North-Holland

Pages from

108

Pages to

111

Pages count

4

BibTex


@article{BUT49824,
  author="Lubomír {Grmela} and Pavel {Škarvada} and Pavel {Tománek} and Robert {Macků} and Steve J. {Smith}",
  title="Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells",
  annote="The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the
emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.",
  address="Elsevier",
  chapter="49824",
  institution="Elsevier",
  number="1",
  volume="96",
  year="2012",
  month="january",
  pages="108--111",
  publisher="Elsevier",
  type="journal article"
}