Publication detail

Nanooptics of locally induced photocurrent in Si solar cells

ŠKARVADA, P. GRMELA, L. ABUETWIRAT, I. TOMÁNEK, P.

Original Title

Nanooptics of locally induced photocurrent in Si solar cells

Type

conference paper

Language

English

Original Abstract

This paper is intended to present the results of our experimental study of local defect in silicon solar cells. Solar cells defects are evaluated by Near-field optical induced photocurrent, scanning near-field optical microscope characterization and noise spectroscopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of breakdown. All type of noise - thermal, shot, generation, recombination and 1/f type of noise play a different role in reliability analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM, NOBIC and noise spectroscopy represent the coupling of very useful methods to provide a non-destructive characterization on silicon semiconductor solar cells.

Keywords

monocrystalline Si, solar cell, locally induced photocurrent

Authors

ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P.

RIV year

2008

Released

27. 8. 2008

Publisher

Zeithamlová Milena, Ing. - Agentura Action M

Location

Prague

ISBN

978-80-86742-25-0

Book

Photonics Prague 2008

Pages from

96

Pages to

97

Pages count

2

BibTex

@inproceedings{BUT27320,
  author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}",
  title="Nanooptics of locally induced photocurrent in Si solar cells",
  booktitle="Photonics Prague 2008",
  year="2008",
  pages="96--97",
  publisher="Zeithamlová Milena, Ing. - Agentura Action M",
  address="Prague",
  isbn="978-80-86742-25-0"
}