Publication detail

Nanooptics of locally induced photocurrent in Si solar cells

ŠKARVADA, P. GRMELA, L. ABUETWIRAT, I. TOMÁNEK, P.

Original Title

Nanooptics of locally induced photocurrent in Si solar cells

Czech Title

Nanooptika lokálně indukovaného fotoproudu v Si solárních článcích

English Title

Nanooptics of locally induced photocurrent in Si solar cells

Type

conference paper

Language

en

Original Abstract

This paper is intended to present the results of our experimental study of local defect in silicon solar cells. Solar cells defects are evaluated by Near-field optical induced photocurrent, scanning near-field optical microscope characterization and noise spectroscopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of breakdown. All type of noise - thermal, shot, generation, recombination and 1/f type of noise play a different role in reliability analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM, NOBIC and noise spectroscopy represent the coupling of very useful methods to provide a non-destructive characterization on silicon semiconductor solar cells.

Czech abstract

Článek přináší výsledky experimentálního studia lokálních defektů v křemíkových solárních článcích. Ty jsou zjišťovány pomocí metody NOBIC, tj. lokálně indukovaném fotoproudu v blízkém poli, topografií a lokální odrazivostí měřenou pomocí SNOM a šumovou spektroskopií. Korelace mezi šumem a transportními charakteristikami indikuje možnosti tohoto diagnostického nástroje, který je navíc doplněn o metody SNOM, NOBIC tak, že je možné provádět několik nedestruktivních měření na křemíkových solárních článcích současně.

English abstract

This paper is intended to present the results of our experimental study of local defect in silicon solar cells. Solar cells defects are evaluated by Near-field optical induced photocurrent, scanning near-field optical microscope characterization and noise spectroscopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of breakdown. All type of noise - thermal, shot, generation, recombination and 1/f type of noise play a different role in reliability analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM, NOBIC and noise spectroscopy represent the coupling of very useful methods to provide a non-destructive characterization on silicon semiconductor solar cells.

Keywords

monocrystalline Si, solar cell, locally induced photocurrent

RIV year

2008

Released

27.08.2008

Publisher

Zeithamlová Milena, Ing. - Agentura Action M

Location

Prague

ISBN

978-80-86742-25-0

Book

Photonics Prague 2008

Pages from

96

Pages to

97

Pages count

2

BibTex


@inproceedings{BUT27320,
  author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}",
  title="Nanooptics of locally induced photocurrent in Si solar cells",
  annote="This paper is intended to present the results of our experimental study of local defect in silicon solar cells. Solar cells defects are evaluated by Near-field optical induced photocurrent, scanning near-field optical microscope characterization and noise spectroscopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of breakdown. All type of noise - thermal, shot, generation, recombination and 1/f type of noise play a different role in reliability analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM, NOBIC and noise spectroscopy represent the coupling of very useful methods to provide a non-destructive characterization on silicon semiconductor solar cells.",
  address="Zeithamlová Milena, Ing. - Agentura Action M",
  booktitle="Photonics Prague 2008",
  chapter="27320",
  howpublished="electronic, physical medium",
  institution="Zeithamlová Milena, Ing. - Agentura Action M",
  year="2008",
  month="august",
  pages="96--97",
  publisher="Zeithamlová Milena, Ing. - Agentura Action M",
  type="conference paper"
}