Publication detail

Local measurement of solar cell emission characteristics

ŠKARVADA, P. TOMÁNEK, P. GRMELA, L.

Original Title

Local measurement of solar cell emission characteristics

Czech Title

Lokální měření emisních charakteristik solárních článků

English Title

Local measurement of solar cell emission characteristics

Type

journal article

Language

en

Original Abstract

Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial damage defects. Finally, the scratched areas are inspected as sites of local structure damage.

Czech abstract

Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial damage defects. Finally, the scratched areas are inspected as sites of local structure damage.

English abstract

Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial damage defects. Finally, the scratched areas are inspected as sites of local structure damage.

Keywords

solar cell, defect characterization, light emission

RIV year

2011

Released

01.11.2011

Publisher

SPIE

Location

USA

Pages from

1H1

Pages to

1H6

Pages count

6

BibTex


@article{BUT75043,
  author="Pavel {Škarvada} and Pavel {Tománek} and Lubomír {Grmela}",
  title="Local measurement of solar cell emission characteristics",
  annote="Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial damage defects. Finally, the scratched areas are inspected as sites of local structure damage.",
  address="SPIE",
  chapter="75043",
  institution="SPIE",
  number="8306",
  volume="8036",
  year="2011",
  month="november",
  pages="1H1--1H6",
  publisher="SPIE",
  type="journal article"
}