Publication detail

SEM and AFM imaging of solar cells defects

ŠKARVADA, P. MACKŮ, R. DALLAEVA, D. SEDLÁK, P. GRMELA, L. TOMÁNEK, P.

Original Title

SEM and AFM imaging of solar cells defects

Czech Title

SEM a AFM zobrazování vad solárních článků

English Title

SEM and AFM imaging of solar cells defects

Type

journal article

Language

en

Original Abstract

The paper deals with the successive localization and imaging of solar cell defects, going from macroscale to microscale. For the purpose of localization, the light emission from reversed bias samples is used. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. The type of microscopic defects are discernable from their current-voltage plot or from noise measurements. Two specific defects, both of the avalanche type, with different voltage threshold, are presented in this paper. Current voltage plots and radiant flux versus voltage characteristics for two temperatures, topography, shadow map and corresponding SEM micrographs are shown for both samples.

Czech abstract

Papír se zabývá postupným lokalizaci a zobrazování závad solárních článků, které jdou od makroměřítku do mikroměřítku. Pro účely lokalizace, je použita pro vyzařování světla z reverzní vzorků zkreslení. Po hrubém makroskopické lokalizace, mikroskopický lokalizace pomocí mikroskopie skenovací sondou v kombinaci s photomultiplier (stínové mapování), se provádí. Typ mikroskopických vad jsou rozeznatelné od jejich aktuální napětí pozemku nebo z měření hluku. Dva konkrétní vady, a to jak typu laviny, s různou prahové napětí, jsou uvedeny v tomto článku. Aktuální grafy napětí a zářivý tok proti charakteristik napětí pro dvě teploty, topografie, stín mapy a odpovídající REM jsou uvedeny na obou vzorků.

English abstract

The paper deals with the successive localization and imaging of solar cell defects, going from macroscale to microscale. For the purpose of localization, the light emission from reversed bias samples is used. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. The type of microscopic defects are discernable from their current-voltage plot or from noise measurements. Two specific defects, both of the avalanche type, with different voltage threshold, are presented in this paper. Current voltage plots and radiant flux versus voltage characteristics for two temperatures, topography, shadow map and corresponding SEM micrographs are shown for both samples.

Keywords

Solar cells; Photomicroscopy; Scanning probe microscopy

RIV year

2015

Released

06.01.2015

Publisher

SPIE

Location

Bellingham, USA

Pages from

1

Pages to

6

Pages count

6

BibTex


@article{BUT113013,
  author="Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Petr {Sedlák} and Lubomír {Grmela} and Pavel {Tománek}",
  title="SEM and AFM imaging of solar cells defects",
  annote="The paper deals with the successive localization and imaging of solar cell defects, going from macroscale to microscale. For the purpose of localization, the light emission from reversed bias samples is used. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. The type of microscopic defects are discernable from their current-voltage plot or from noise measurements. Two specific defects, both of the avalanche type, with different voltage threshold, are presented in this paper. Current voltage plots and radiant flux versus voltage characteristics for two temperatures, topography, shadow map and corresponding SEM micrographs are shown for both samples.",
  address="SPIE",
  chapter="113013",
  doi="10.1117/12.2049046",
  institution="SPIE",
  number="9450",
  volume="9450",
  year="2015",
  month="january",
  pages="1--6",
  publisher="SPIE",
  type="journal article"
}