Publication detail

Local investigation of defects in monocrystalline silicon solar cells

TOMÁNEK, P. ŠKARVADA, P. GRMELA, L. MACKŮ, R. SMITH, S.

Original Title

Local investigation of defects in monocrystalline silicon solar cells

Type

journal article - other

Language

English

Original Abstract

We present results of microscale localization and characterization of defects in monocrystalline silicon solar cells using LBIC and Scanning near-field optical microscopy (SNOM). Although etched silicon is still most effective material for solar cells, some problems with their use in solar plant installation persist due to the defects.

Keywords

monocrystalline silicon, solar cell, defect, LBIC, SNOM

Authors

TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S.

RIV year

2012

Released

6. 7. 2012

Publisher

IEEE USA

Location

Seattle, USA

ISBN

0160-8371

Periodical

Conference Record of the IEEE Photovoltaic Specialists Conference

Year of study

2012

Number

1

State

United States of America

Pages from

1686

Pages to

1690

Pages count

5

BibTex

@article{BUT95657,
  author="Pavel {Tománek} and Pavel {Škarvada} and Lubomír {Grmela} and Robert {Macků} and Steve J. {Smith}",
  title="Local investigation of defects in monocrystalline silicon solar cells",
  journal="Conference Record of the IEEE Photovoltaic Specialists Conference",
  year="2012",
  volume="2012",
  number="1",
  pages="1686--1690",
  doi="10.1109/PVSC.2011.6186279",
  issn="0160-8371"
}