Publication detail

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

ŠKARVADA, P. TOMÁNEK, P. GRMELA, L.

Original Title

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

Czech Title

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

English Title

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

Type

abstract

Language

en

Original Abstract

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

Czech abstract

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

English abstract

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

Keywords

solar cell

Released

30.06.2010

Publisher

Vutium

Location

Brno

ISBN

978-80-214-4112-5

Book

Materials structure and micromechanics of fracture

Pages from

160

Pages to

160

Pages count

1

BibTex


@misc{BUT61077,
  author="Pavel {Škarvada} and Pavel {Tománek} and Lubomír {Grmela}",
  title="Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency",
  annote="Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.",
  address="Vutium",
  booktitle="Materials structure and micromechanics of fracture",
  chapter="61077",
  institution="Vutium",
  year="2010",
  month="june",
  pages="160--160",
  publisher="Vutium",
  type="abstract"
}