Publication detail

Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties

ŠIK, O. BÁBOR, P. ŠKARVADA, P. POTOČEK, M. TRČKA, T. GRMELA, L. BELAS, E.

Original Title

Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties

English Title

Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties

Type

journal article

Language

en

Original Abstract

Scanning Electron microscopy and Atomic Force Microscopy and X-ray photoemission spectroscopy were used to investigate the effect of argon ion bombardment on the surface of CdZnTe crystal structural morphology. The sample was irradiated by defined doses of 5 keV argon ions. We observed sudden increase of the surface roughness at low doses. After irradiation by higher doses up to 1.4 × 1016 ions/cm2, surface showed its smoothening. This value showed to be optimal for oxidized damaged layer removal and surface smoothening. AFM analysis confirmed lowest roughness of the surface. Higher values of ion fluences caused increasing roughness and waviness of the surface and creation of craters on the surface. The XPS analysis showed no preferential removal of Cd, Zn or Te by used ion irradiation doses. Sputter rate stabilized from ion fluences higher than 7 × 1015 Ar+ ions/cm2. Possible origin of this craters and their cross-like alignment is explained.

English abstract

Scanning Electron microscopy and Atomic Force Microscopy and X-ray photoemission spectroscopy were used to investigate the effect of argon ion bombardment on the surface of CdZnTe crystal structural morphology. The sample was irradiated by defined doses of 5 keV argon ions. We observed sudden increase of the surface roughness at low doses. After irradiation by higher doses up to 1.4 × 1016 ions/cm2, surface showed its smoothening. This value showed to be optimal for oxidized damaged layer removal and surface smoothening. AFM analysis confirmed lowest roughness of the surface. Higher values of ion fluences caused increasing roughness and waviness of the surface and creation of craters on the surface. The XPS analysis showed no preferential removal of Cd, Zn or Te by used ion irradiation doses. Sputter rate stabilized from ion fluences higher than 7 × 1015 Ar+ ions/cm2. Possible origin of this craters and their cross-like alignment is explained.

Keywords

Cadmium telluride; Surface ion modification; Surface structure; Surface reconstruction; Surface roughness; XPS

Released

25.11.2016

Publisher

Elsevier B.V.

Location

London

Pages from

75

Pages to

81

Pages count

7

URL

BibTex


@article{BUT124626,
  author="Ondřej {Šik} and Petr {Bábor} and Pavel {Škarvada} and Michal {Potoček} and Tomáš {Trčka} and Lubomír {Grmela} and Eduard {Belas}",
  title="Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties
",
  annote="Scanning Electron microscopy and Atomic Force Microscopy and X-ray photoemission spectroscopy were used to investigate the effect of argon ion bombardment on the surface of CdZnTe crystal structural morphology. The sample was irradiated by defined doses of 5 keV argon ions. We observed sudden increase of the surface roughness at low doses. After irradiation by higher doses up to 1.4 × 1016 ions/cm2, surface showed its smoothening. This value showed to be optimal for oxidized damaged layer removal and surface smoothening. AFM analysis confirmed lowest roughness of the surface. Higher values of ion fluences caused increasing roughness and waviness of the surface and creation of craters on the surface. The XPS analysis showed no preferential removal of Cd, Zn or Te by used ion irradiation doses. Sputter rate stabilized from ion fluences higher than 7 × 1015 Ar+ ions/cm2. Possible origin of this craters and their cross-like alignment is explained.",
  address="Elsevier B.V.",
  chapter="124626",
  doi="10.1016/j.surfcoat.2016.05.006",
  howpublished="online",
  institution="Elsevier B.V.",
  number="A",
  volume="306",
  year="2016",
  month="november",
  pages="75--81",
  publisher="Elsevier B.V.",
  type="journal article"
}