Mgr.

Dinara Sobola

Ph.D.

FEKT, UFYZ – vědecký pracovník

+420 54114 6020
sobola@feec.vutbr.cz

Odeslat VUT zprávu

Mgr. Dinara Sobola, Ph.D.

Publikace

  • 2019

    KASPAR, P.; SOBOLA, D.; SEDLÁK, P.; HOLCMAN, V.; GRMELA, L. Analysis of Color Shift on Butterfly Wings by Fourier Transform of Images from Atomic Force Microscopy. MICROSCOPY RESEARCH AND TECHNIQUE, 2019, č. 1, s. 1-7. ISSN: 1097-0029.
    Detail | WWW

    DALLAEV, R.; ORLOVA, L.; SOBOLA, D. Imaging of structures at butterfly wings by atomic force microscopy. In PROSPECTS FOR THE DEVELOPMENT OF THE AUTOMIBLE TRANSPORT: INNOVATIONS, PROJECTS, STAFF. 2019. s. 241-245. ISBN: 978-5-00128-244-0.
    Detail

    KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. Applied Surface Science, 2019, roč. 493, č. 1, s. 673-678. ISSN: 0169-4332.
    Detail | WWW

    SOBOLA, D.; PAPEŽ, N.; DALLAEV, R.; RAMAZANOV, S.; HEMZAL, D.; HOLCMAN, V. Characterization of nanoblisters on HOPG surface. In Journal of ELECTRICAL ENGINEERING. Journal of Electrical Engineering. FEI STU Bratislava: De Gruyter OPEN, 2019. s. 132-136. ISSN: 1335-3632.
    Detail | WWW

    DALLAEV, R.; STACH, S.; TALU, S.; SOBOLA, D.; MÉNDEZ-ALBORES, A.; TREJO, G.; GRMELA, L. Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. Silicon, 2019, roč. 11, č. 1, s. 1-15. ISSN: 1876-990X.
    Detail | WWW

    ŢĂLU, Ş.; YADAV, R.; ARMAN, A.; KORPI, A.; SOBOLA, D.; TALU, M.; REZAEE, S.; ACHOUR, A.; JUREČKA, S.; MARDANI, M. Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion. Vakuum in Forschung und Praxis, 2019, roč. 1, č. 30, s. 30-35. ISSN: 1522-2454.
    Detail

    SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S. Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND, 2019, č. 2, s. 1-6. ISSN: 2083-134X.
    Detail | WWW

    TALU, S.; SOBOLA, D.; DALLAEV, R. Micro-courses for education to scanning probe microscopy. In Proceedings of the 1st International Scientific Conference "Modern Management Trends and the Digital Economy: from Regional Development to Global Economic Growth". Proceedings of the International Scientific Conference "Modern Management Trends and the Digital Economy: from Regional Development to Global Economic Growth". In AEBMR. This is an open access article under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).: Atlantis Press, 2019. s. 546-549. ISBN: 978-94-6252-721-8. ISSN: 2352-5428.
    Detail | WWW

  • 2018

    PAPEŽ, N.; SOBOLA, D.; GAJDOŠ, A.; ŠKVARENINA, Ľ.; MACKŮ, R.; ELIÁŠ, M.; NEBOJSA, A.; MOTÚZ, R. Surface morphology after reactive ion etching of silicon and gallium arsenide based solar cells. Journal of Physics: Conference Series, 2018, roč. 1124, č. 4, s. 165-171. ISSN: 1742-6596.
    Detail | WWW

    GAJDOŠ, A.; ŠKARVADA, P.; MACKŮ, R.; PAPEŽ, N.; ŠKVARENINA, Ľ.; SOBOLA, D. Isolation and optoelectronic characterization of Si solar cells microstructure defects. Journal of Physics: Conference Series, 2018, roč. 1124, č. 4, s. 1-6. ISSN: 1742-6596.
    Detail | WWW

    ŢĂLU, Ş.; SOBOLA, D.; PAPEŽ, N.; DALLAEV, R.; SEDLÁK, P. Efficient processing of data acquired using microscopy techniques. In DEStech Transactions on Social Science, Education and Human Science. DEStech Transactions on Social Science Education and Human Science. Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2018. s. 202-207. ISBN: 978-1-60595-566-7. ISSN: 2475-0042.
    Detail | WWW

    TALU, S.; SOBOLA, D.; SOLAYMANI, S.; DALLAEV, R.; BRÜSTLOVÁ, J. Scale-dependent Choice of Scanning Rate for AFM Measurements. In DEStech Transactions on Computer Science and Engineering. DEStech Transactions on Computer Science and Engineering. EStech Transactions on Computer Science and Engineering, 2018. s. 453-459. ISBN: 978-1-60595-065-5. ISSN: 2475-8841.
    Detail | WWW

    PAPEŽ, N.; SOBOLA, D.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Applied Surface Science, 2018, č. 461, s. 212-220. ISSN: 0169-4332.
    Detail

    KNÁPEK, A.; HORÁČEK, M.; CHLUMSKÁ, J.; KUPAROWITZ, T.; SOBOLA, D.; ŠIKULA, J. PREPARATION AND NOISE ANALYSIS OF POLYMER GRAPHITE CATHODE. METROL MEAS SYST, 2018, roč. 25, č. 3, s. 451-458. ISSN: 0860-8229.
    Detail | WWW

    TALU, S.; MOROZOV, I.; SOBOLA, D.; ŠKARVADA, P. Multifractal Characterization of Butterfly Wings Scales. BULLETIN OF MATHEMATICAL BIOLOGY, 2018, roč. 80, č. 11, s. 2856-2870. ISSN: 0092-8240.
    Detail | WWW

    TALU, S.; DALLAEV, R.; SOBOLA, D.; ŠKVARENINA, Ľ. Scanning Probe Microscopy of Organisms in Activated Sludge. In 2017 2nd International Conference on Applied Mechanics and Mechatronics Engineering (AMME 2017). DEStech Transactions on Engineering and Technology Research. Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2018. s. 129-135. ISBN: 978-1-60595-521-6. ISSN: 2475-885X.
    Detail | WWW

    Sobola D.S., Dallaev R.S., Orlova L.A. Role of higly oriented pyrolytic graphite in nanofabrication. Actual problems of road traffic education and prospects of development of the industry. 2018. s. 333-336. ISBN: 978-5-00128-041-5.
    Detail

    TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O. How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2018, č. 85, s. 15-23. ISSN: 1369-8001.
    Detail

    GARCZYK, Ż.; STACH, S.; TALU, S.; SOBOLA, D.; WRÓBEL, Z. Segmentation of Three-Dimensional Images of the Butterfly Wing Surface. In Information Technology in Biomedicine. Advances in Intelligent Systems and Computing. 1. Springer, Cham, 2018. s. 111-121. ISBN: 978-3-319-91211-0. ISSN: 2194-5357.
    Detail | WWW

    ŞTEFAN ŢĂLU, RASHID DALLAEV, DINARA SOBOLA. Evaluation of Surface Characteristics of Highly Oriented Pyrolitic Graphite. 2018 2nd International Conference on Advances in Management Science and Engineering (AMSE 2018). 2018. s. 150-154. ISBN: 978-1-60595-566-7.
    Detail

    TALU, S.; PAPEŽ, N.; SOBOLA, D.; TOFEL, P. Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells. In DEStech Transactions on Environment, Energy and Earth Sciences. DEStech Transactions on Environment, Energy and Earth Sciences. DEStech Publications, Inc., 2018. s. 489-493. ISBN: 978-1-60595-514-8. ISSN: 2475-8833.
    Detail | WWW | Plný text v Digitální knihovně

  • 2017

    TALU, S.; SOBOLA, D.; PAPEŽ, N. Analysis and Recommendations for Education Process of Experts in the Field of Scanning Probe Microscopy. In Book Series: DEStech Transactions on Social Science Education and Human Science. DEStech Transactions on Social Science Education and Human Science. 439 North Duke Street Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2017. s. 1-9. ISBN: 978-1-60595-489-9. ISSN: 2475-0042.
    Detail | WWW

    PAPEŽ, N.; ŠKVARENINA, Ľ.; TOFEL, P.; SOBOLA, D. Thermal stability of gallium arsenide solar cells. In Photonics, Devices, and Systems VII. Proceedings of SPIE. 2017. s. 543-548. ISBN: 9781510617032. ISSN: 0277-786X.
    Detail | WWW

    TALU, S.; SOBOLA, D.; TOMÁNEK, P.; STACH, S. Micromorphology of AlN Epilayers on Sapphire Substrates. In DEStech Transactions on Computer Science and Engineering. DEStech Transactions on Computer Science and Engineering. Proceedings CECE 2017. 439 North Duke Street Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2017. s. 465-470. ISBN: 978-1-60595-476-9. ISSN: 2475-8841.
    Detail | WWW

    SOBOLA, D.; TALU, S.; SADOVSKÝ, P.; PAPEŽ, N.; GRMELA, L. Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures. Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk), 2017, roč. 3, č. 15, s. 569-576. ISSN: 1804-3119.
    Detail

    SOBOLA, D.; PAPEŽ, N. Thermal stability of GaAs solar cells. Curie - Pasteur - CEITEC joint young scientist retreat. Brno: 2017. s. 94-94.
    Detail | WWW

    SOBOLA, D.; TALU, S.; TOMÁNEK, P. Surface Condition of GaAs Solar Cells. ACTA TECHNICA CORVINIENSIS , – Bulletin of Engineering, 2017, roč. 10, č. 3, s. 27-32. ISSN: 2067-3809.
    Detail | WWW

    SOBOLA, D.; TALU, S.; SOLAYMANI, S.; GRMELA, L. INFLUENCE OF SCANNING RATE ON QUALITY OF AFM IMAGE: STUDY OF SURFACE STATISTICAL METRICS. Microscopy research and technique, 2017, roč. 80, č. 7, s. 1-11. ISSN: 1059-910X.
    Detail | WWW

    TALU, S.; STACH, S.; RAMAZANOV, S.; SOBOLA, D.; RAMAZANOV, G. Multifractal characterization of epitaxial silicon carbide on silicon. MATERIALS SCIENCE- POLAND, 2017, č. 3, s. 1-9. ISSN: 2083-134X.
    Detail

    KNÁPEK, A.; HORÁČEK, M.; HRUBÝ, F.; ŠIKULA, J.; KUPAROWITZ, T.; SOBOLA, D. Noise behaviour of field emission cathode based on lead pencil graphite. In TECHNICAL DIGEST 2017 30th International Vacuum Nanoelectronics Conference (IVNC). Herzogssaal Regensburg, Germany: IEEE, 2017. s. 274-275. ISBN: 978-1-5090-3974-6.
    Detail

    ŢĂLU, Ş.; PAPEŽ, N.; SOBOLA, D.; ACHOUR, A.; SOLAYMANI, S. Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters. JOURNAL OF MATERIALS SCIENCE- MATERIALS IN ELECTRONICS, 2017, roč. 28, č. 15, s. 1-12. ISSN: 0957-4522.
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    GARCZYK, Ż.; STACH, S.; TALU, S.; SOBOLA, D.; WRÓBEL, Z. Stereometric parameters of butterfly wings. Journal of Biomimetics, Biomaterials and Biomedical Engineering, 2017, č. 31, s. 1-11. ISSN: 2296-9845.
    Detail

    SOBOLA, D.; PAPEŽ, N.; ŠKARVADA, P.; TOMÁNEK, P. Srovnání metod SEM a SPM pro charakterizaci solárních článků. Jemná mechanika a optika, 2017, č. 62, s. 81-83. ISSN: 0447-6441.
    Detail | WWW

    PAPEŽ, N.; SOBOLA, D.; ŠKARVADA, P.; ŠKVARENINA, Ľ.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Progress in Applied Surface, Interface and Thin Film Science - Solar Renewable Energy News 2017. Bratislava: Comenius University, 2017. s. 105-105. ISBN: 978-80-223-4411-1.
    Detail

  • 2016

    ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S. Multiscale experimental characterization of solar cell defects. In 20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics. Proceedings of SPIE. SPIE Proceedings. Bellingham, USA: SPIE, 2016. s. 101420U1 (101420U7 s.)ISBN: 9781510607330. ISSN: 0277-786X.
    Detail

    KNÁPEK, A.; SOBOLA, D.; TOMÁNEK, P.; POKORNÁ, Z.; URBÁNEK, M.; HOLCMAN, V. Field emission from the surface of highly ordered pyrolytic graphite. Applied Surface Science, 2016, roč. 2016, č. 12, s. 1-5. ISSN: 0169-4332.
    Detail | WWW

    SOBOLA, D.; SADOVSKÝ, P.; ŠKARVADA, P.; TOMÁNEK, P. Analýza povrchového reliéfu solárních článků. Jemná mechanika a optika, 2016, roč. 11- 12, č. 61, s. 275-276. ISSN: 0447-6441.
    Detail | WWW

  • 2015

    DALLAEVA, D.; SADOVSKÝ, P.; TOMÁNEK, P. Role of Surface Features of Butterfly Wings in Optical Properties Characterization. DGaO- PROCEEDINGS, 2015, roč. 2015, č. 2015, s. 1-2. ISSN: 1614- 8436.
    Detail | WWW

    RAMAZANOV, S.; TALU, S.; DALLAEVA, D.; STACH, S.; RAMAZANOV, G. Epitaxy of silicon carbide on silicon: micromorphological analysis of growth surface evolution. SUPERLATTICES AND MICROSTRUCTURES, 2015, roč. 2015, č. 85, s. 395-402. ISSN: 0749-6036.
    Detail

    STACH, S.; DALLAEVA, D.; TALU, S.; KASPAR, P.; TOMÁNEK, P.; GIOVANZANA, S.; GRMELA, L. Morphological features in aluminum nitride epilayers prepared by magnetron sputtering. MATERIALS SCIENCE-POLAND, 2015, roč. 33, č. 1, s. 175-184. ISSN: 0137-1339.
    Detail

    ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P. SEM and AFM imaging of solar cells defects. Proceedings of SPIE, 2015, roč. 9450, č. 9450, s. 1-6. ISSN: 0277-786X.
    Detail

    DALLAEVA, D.; RAMAZANOV, S.; RAMAZANOV, G.; AKHMEDOV, R.; TOMÁNEK, P. Characterizing SiC-AlN semiconductor solid solutions with indirect and direct bandgaps. Proceedings of SPIE, 2015, roč. 9450, č. 9450, s. 94501R-1 (94501R-6 s.)ISSN: 0277-786X.
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    DALLAEVA, D.; TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells. Proceedings of SPIE, 2015, roč. 9450, č. 9450, s. 94501O-1 (94501O-7 s.)ISSN: 0277-786X.
    Detail

    DALLAEVA, D.; TOMANEK, P.; PROKOPYEVA, E.; KASPAR, P.; GRMELA, L.; SKARVADA, P. AFM imaging of natural optical structures. Proceedings of SPIE, 2015, roč. 9442, č. 9442, s. 944209-1 (944209-8 s.)ISSN: 0277-786X.
    Detail

    DALLAEVA, D.; RAMAZANOV, S.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L. Local topography of optoelectronic substrates prepared by dry plasma etching process. Proceedings of SPIE, 2015, roč. 9442, č. 9442, s. 9442081-9442086. ISSN: 0277-786X.
    Detail

    TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L. Microscale localization and detection of defects in crystalline silicon solar cells. DGaO- PROCEEDINGS, 2015, roč. 2015, č. 2015, s. 1-2. ISSN: 1614- 8436.
    Detail | WWW

    SOBOLA, D.; TALU, S.; SADOVSKÝ, P.; TOMÁNEK, P. Application of AFM measurement and fractal analysis to study the surface of natural optical structures. In Extended Abstract Book of conference Progress in Applied Surface, Interface and Thin Film Science 2015. Bratislava: Comenus University, 2015. s. 127-128. ISBN: 978-80-223-3975- 9.
    Detail

    SOBOLA, D. NON- DESTRUCTIVE LOCAL DIAGNOSTICS OF OPTOELECTRONIC DEVICES. FEKT VUT: 2015. s. 1-108.
    Detail

    ŠKARVADA, P.; ŠKVARENINA, Ľ.; SOBOLA, D.; MACKŮ, R.; TOMÁNEK, P.; GRMELA, L. Multiscale characterization of solar cells. In Progress in Applied Surface, Interface and Thin- film Science 2015. Bratislava, Slovensko: Comenius University, 2015. s. 148-151. ISBN: 978-80-223-3975- 9.
    Detail

  • 2014

    DALLAEVA, D.; TOMÁNEK, P.; SAFARALIEV, G.; KARDASHOVA, G. High-Density Ceramic Materials on the Basis of Silicon Carbide. Key Engineering Materials (print), 2014, roč. 592-593, č. 592, s. 397-400. ISSN: 1013-9826.
    Detail

    DALLAEVA, D. Surface roughness of aluminum nitride epilayers prepared by magnetron sputtering. In Proceedings of the 20th conference. Volume 3. Brno: LITERA Brno, 2014. s. 120-124. ISBN: 978-80-214-4922- 0.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; SMITH, S.; GRMELA, L. A variety of microstructural defects in crystalline silicon solar cells. Applied Surface Science, 2014, roč. 312, č. 312, s. 50-56. ISSN: 0169-4332.
    Detail

    DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science, 2014, roč. 312, č. 312, s. 81-86. ISSN: 0169-4332.
    Detail

    DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; RAMAZANOV, S. Interferometry and Atomic force microscopy of substrates for optoelectronics proceeded by dry plasma etching. In 2014 International Symposium on Optomechatronic Technologies (ISOT 2014). Proceedings. The Computer Security Foundations Workshop III. Los Alamitos, CA, USA: IEEE Computer Society Press, 2014. s. 283-287. ISBN: 978-1-4799-6666-0. ISSN: 1063-6900.
    Detail

    DALLAEVA, D.; RAMAZANOV, S.; PROKOPYEVA, E.; BRÜSTLOVÁ, J.; TOMÁNEK, P. Lokální topografie optoelektronických substrátů připravených pomocí plazmového leptání. Jemná mechanika a optika, 2014, roč. 59, č. 11- 12, s. 299-302. ISSN: 0447- 6441.
    Detail

    DALLAEVA, D.; RAMAZANOV, S.; PROKOPYEVA, E.; KASPAR, P.; TOMANEK, P. AFM Imaging of Natural Optical Structures. Advances in Electrical and Electronic Engineering - intenetový časopis, (http://advances.utc.sk), 2014, roč. 12, č. 6, s. 639-644. ISSN: 1804- 3119.
    Detail

  • 2013

    DALLAEVA, D.; TOMÁNEK, P.; BILALOV, B.; KOROSTYLEV, E. SEM a AFM studie morfologie tenkých vrstev tuhého roztoku SiC- AlN. Jemná mechanika a optika, 2013, roč. 58, č. 3, s. 75-77. ISSN: 0447- 6441.
    Detail

    ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L. Microstructure defects in silicon solar cells. In Proceedings of 8th Solid state surfaces and intefaces. 1. Bratislava: Comenius University Bratislava, 2013. s. 168-169. ISBN: 978-80-223-3501- 0.
    Detail

    TOMÁNEK, P.; ŠKARVADA, P.; DALLAEVA, D.; GRMELA, L.; MACKŮ, R.; SMITH, S. Cold field emission electrode as a local probe of proximal microscopes- Investigation of defects in monocrystalline silicon solar cells. WORLD JOURNAL OF ENGINEERING, 2013, roč. 10, č. 2, s. 119-124. ISSN: 1708- 5284.
    Detail

    DALLAEVA, D. Morphology and structural investigation of aluminum nitride layers prepared by magnetron sputtering. In Proceedings of the 19th Conference Student EEICT 2013. první. Brno University of Technology: Litera, Tabor 43a, 61200 Brno, 2013. s. 134-138. ISBN: 978-80-214-4695- 3.
    Detail

    DALLAEVA, D.; ŠKARVADA, P.; TOMÁNEK, P.; SMITH, S.; SAFARALIEV, G.; BILALOV, B.; GITIKCHIEV, M.; KARDASHOVA, G. Structural properties of Al2O3/AlN thin film prepared by magnetron sputtering of Al in HF- activated nitrogen plasma. Thin Solid Films, 2013, roč. 526, č. 526, s. 92-96. ISSN: 0040- 6090.
    Detail

    DALLAEVA, D.; KOROSTYLEV, E.; BILALOV, B.; TOMÁNEK, P. Scanning proximal microscopy study of the thin layers of silicon carbide aluminum nitride solid solution manufactured by fast sublimation epitaxy. EPJ Web of Conferences, 2013, roč. 48, č. 48, s. 00002. 1 (0002.4 s.)ISSN: 2100- 014X.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; DALLAEVA, D. Microscopic optoelectronic defectoscopy of solar cells. EPJ Web of Conferences, 2013, roč. 48, č. 48, s. 00026. 1 (00026.4 s.)ISSN: 2100- 014X.
    Detail

    KLAMPÁR, M.; LIEDERMANN, K.; SPOHNER, M.; ŠKARVADA, P.; DALLAEVA, D.; KOBRTEK, J. Dielectric properties of epoxy resins with oxide nanofillers and their accelerated ageing. In IEEE Catalog Number CFP13EEI- USB. Ottawa, Ontario, Canada: Ottawa, Ontario, 2013. s. 159-164. ISBN: 978-1-4673-4739- 6.
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    DALLAEVA, D. Biological solids of the sewage- purification facilities. In Proceedings of the International Summer School on Application of Scanning Probe Microscopy in Life Sciences, Soft Matter and Nanofabrication. Aalborg 2013: River Publishers, 2013. s. 1 (1 s.). ISBN: 9788793102330.
    Detail

    KLAMPÁR, M.; LIEDERMANN, K.; SPOHNER, M.; DALLAEVA, D. Dielectric properties of epoxides with Al2O3nanofier and their exposureto acceerated ageing. In IIPhDW 2013 Proceedings. Brno: Brno, 2013. s. 100-103. ISBN: 978-80-214-4759- 2.
    Detail

    BOGATYREVA, N.; BARTLOVÁ, M.; AUBRECHT, V.; ŠKARVADA, P.; DALLAEVA, D. APPROXIMATE CALCULATIONS OF RADIATION EMISSION FROM SF6 ARC PLASMAS WITH CU VAPOURS. In Proceedings of XX Symposium on Physics of Switching Arc, Invited Lectures and Contributed Papers. Brno- Letohrad: VUT v Brně, OEZ Letohrad, 2013. s. 92-95. ISBN: 978-80-214-4753- 0.
    Detail

    ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S. Optical and electrical detection and localization of solar cell defects on microscale. Proceedings of SPIE, 2013, roč. 8825, č. 8825, s. 8825071-88255077. ISSN: 0277- 786X.
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    DALLAEVA, D.; RAMAZANOV, S.; KLAMPÁR, M.; TOMÁNEK, P. Study of Dry Etching Process for Substrates Preparation. In International Interdisciplinary PhD Workshop 2013. Brno: Brno University of Technology, 2013. s. 60-64. ISBN: 978-80-214-4759- 2.
    Detail

    DALLAEVA, D. Osobennosti mikroorganizmov aktivnogo ila. GLOBAL SCIENTIFIC POTENTIAL, 2013, roč. 5, č. 26, s. 7-9. ISSN: 1997- 9355.
    Detail | WWW

    DALLAEVA, D.; TOMÁNEK, P. Substrate Preparation for Manufacturing of Aluminum Nitride Layers. ElectroScope - http://www.electroscope.zcu. cz, 2013, roč. 2013, č. 5, s. 1-5. ISSN: 1802- 4564.
    Detail

    PAVELKA, J.; ŠIKULA, J.; TACANO, M.; CHVÁTAL, M.; DALLAEVA, D.; GRMELA, L. Noise sources in interface between mono- crystalline and amorphous semiconductors. In Proceedings of 8th solid state surfaces and interfaces. Bratislava: Comenius University, 2013. s. 128-129. ISBN: 978-80-223-3501- 0.
    Detail

    DALLAEVA, D.; TALU, S.; STACH, S.; ŠKARVADA, P.; TOMÁNEK, P.; TALU, M.; GRMELA, L. AFM imaging and fractaí analysis of surface roughness of AlN epilayers deposited on saphire substrate. In Proceedings of 8th Solid State Surfaces and Interfaces. Bratislava: Comenius University, 2013. s. 33-34. ISBN: 978-80-223-3501- 0.
    Detail

    ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; DALLAEVA, D. Lokální optoelektronická diagnostika mikroskopických vad v solárním křemíkovém článku. Jemná mechanika a optika, 2013, roč. 2013, č. 3, s. 81-84. ISSN: 0447- 6441.
    Detail

  • 2012

    ŠKARVADA, P.; TOMÁNEK, P.; DALLAEVA, D. Solar Cell Structure Defects and Cracks. In Fracture Mechanics for Durability, Reliability and Safety. Kazaň: 2012. s. 507-514. ISBN: 978-5-905576-18- 8.
    Detail

    MACKŮ, R.; ŠICNER, J.; DALLAEVA, D. An Experimentally Based Characterization of Solar Cell Structure Defects by Means of Noise and Optical Activities Analysis. In Fracture Mechanics for Durability, Reliability and Safety. Kazaň: Research Center for power engineering progblems of the russian academy of sciences, 2012. s. 499-506. ISBN: 978-5-905576-18- 8.
    Detail

    ŠICNER, J.; KOKTAVÝ, P.; DALLAEVA, D. Identification of Micro- scale Defects in Crystalline Solar Cell Structure. In Fracture Mechanics for Durability, Reliability and Safety. Kazaň: 2012. s. 532-539. ISBN: 978-5-905576-18- 8.
    Detail

    DALLAEVA, D.; BILALOV, B.; TOMÁNEK, P. Theoretical and Experimental Investigation of SiC Thin Films Surface. ElectroScope - http://www.electroscope.zcu. cz, 2012, roč. 2012, č. 5, s. 1-5. ISSN: 1802- 4564.
    Detail

    DALLAEVA, D.; ARKHIPOV, A. Izgotovlenie strukturirovannyh vysokoprochnyh pokrytij na osnove karbida kremnija i nitrida aljuminija. In Conference proceedings Relevant problems of physics. PUBLISHING of the Southern Federal University: PUBLISHING of the Southern Federal University, 2012. s. 59-61. ISBN: 978-5-9275-1008- 5.
    Detail

    DALLAEVA, D.; ARKHIPOV, A. Izgotovlenie keramicheskih mishenej metodom elektroimpulsnogo spekanija dlja synteza nanorazmernyh sloev. In Conference proceedings Relevant problems of physics. first. Southern Federal University: PUBLISHING of the Southern Federal University, 2012. s. 57-58. ISBN: 978-5-9275-1008- 5.
    Detail

    DALLAEVA, D.; BILALOV, B.; ARKHIPOV, A.; ABUETWIRAT, I. Osobennosti mezhdisciplinarnogo podhoda k izucheniju estestvennyh nauk na sovremennom jetape. In Materials of III All Russian conference: Innovation, science. education: ways of integrations, problems, contradictions. First. Derbent: FGBOU VPO DGTU v g. Derbente, 2012. s. 70-72. ISBN: 5-230-12933- 6.
    Detail

    DALLAEVA, D.; TOMÁNEK, P.; BILALOV, B. Scanning electron microscopy of the thin layers of silicon carbide- aluminum nitride solid solution formatted by sublimation epitaxy. In Optics and Measurement 2012. first edition. Prague 8: Institute of Plasma Physics AS CR, v.v.i. - TOPTEC, 2012. s. 5-8. ISBN: 978-80-87026-02- 1.
    Detail

    TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; DALLAEVA, D. Optoelectronic diagnostics of defects in solar cell structures. In Optica and Measurement 2012. Prague: Institute of plasma Physics, 2012. s. 137-140. ISBN: 978-80-87026-02- 1.
    Detail

    DALLAEVA, D.; TOMÁNEK, P.; RAMAZANOV, S. Scanning tunneling microscopy of high-resistance SiC- AlN solid solutions. In New trends in physics 2012. Brno: Vysoke uceni technicke v Brne, Fakulta elektrotechniky a komunikacnich technologii, Ustav fyziky, 2012. s. 149-152. ISBN: 978-80-214-4594- 9.
    Detail

    DALLAEVA, D.; TOMÁNEK, P. AFM study of structure influence on butterfly wings coloration. Advances in Electrical and Electronic Engineering - intenetový časopis, (http://advances.utc.sk), 2012, roč. 10, č. 2, s. 120-124. ISSN: 1804- 3119.
    Detail

    DALLAEVA, D.; SAFARALIEV, G.; BILALOV, B.; KARDASHOVA, G.; TOMÁNEK, P. Formation and study of SiC and AlN epilayers. In IMAPS CS International Conference. Electronic Devices and Systems. EDS'12. Proceedings. LITERA, Tabor 43a, 61200 Brno: Vysoke uceni technicke v Brne, 2012. s. 111-115. ISBN: 978-80-214-4539- 0.
    Detail

    DALLAEVA, D.; BILALOV, B.; SAFARALIEV, G.; KARDASHOVA, G.; TOMÁNEK, P.; ARKHIPOV, A. Investigation of the ion sputtering process of the (SiC)1-x(AlN) x ceramic target. In IMAPS CS International Conference. Electronic Devices and Systems. EDS'12. Proceedings. FIRST. LITERA, Tabor 43a, 61200 Brno: Vysoke uceni technicke v Brne, 2012. s. 49-53. ISBN: 978-80-214-4539- 0.
    Detail

    DALLAEVA, D. Morphology and structural investigation of silicon carbide layers formated by sublimation. In Proceedings of the 18th Conference STUDENT EEICT, vol. 3. vol. 3. Brno: LITERA Brno, Tabor 43a, 612 00 Brno, 2012. s. 239-243. ISBN: 978-80-214-4462- 1.
    Detail

    DALLAEVA, D. Innovacionnyj podhod i modernizacija uchebnogo processa dlja podgotovki specialistov v oblasti skanirujuwej zondovoj mikroskopii. In the World of Scientific Discoveries, 2012, roč. 2.3(26), č. 02. 2012, s. 31-43. ISSN: 2072- 0831.
    Detail | WWW

    DALLAEVA, D.; ŠKARVADA, P.; ARKHIPOV, A. Mezhdisciplinarnyj podhod k obucheniju inzhenerno- tehnicheskogo personala. In Materials of III All Russian conference: Innovation, science,education: ways of integrations, problems, contradictions. First. Derbent: FGBOU VPO DGTU, 2012. s. 201-204. ISBN: 5-230-12933- 6.
    Detail

  • 2011

    BILALOV, B.; KARDASHOVA, G.; GITIKCHIEV, M.; SOBOLA, D.; ABDURAZAKOV, A. Magnetron sputtering of (SiC)1-x(AlN) x solid solution thin films. In International conference INNOVATIKA 2011. Machachkala: State Dagestan University, 2011. s. 138-139.
    Detail

    BILALOV, B.; KARDASHOVA, G.; ABDURAZAKOV, A.; SOBOLA, D.; ARKHIPOV, A. Peculiarities of the obtaining process of silicon carbide and aluminum nitride. In Proceedings of Internationalscientific conference: Advanced technologies, equipment and analytical systems for material sciences and nanomaterials. K.V. Kozitov. Kursk: Southwest state university, 2011. s. 829-831. ISBN: 978-5-7681-0642- 3.
    Detail

    BILALOV, B.; SAFARALIEV, G.; KARDASHOVA, G.; SOBOLA, D.; EUBOV, S. Technical features of creation new synthesis technologies of nano-, micro- and monocrystalline SiC film at 1000 oC. In International conference INNOVATIKA 2011. Machachkala: Dagestan State University, 2011. s. 116-118.
    Detail | WWW

    SAFARALIEV, G.; BILALOV, B.; DALLAEVA, D.; RAMAZANOV, S.; GERAEV, K.; TOMÁNEK, P. Investigation of optical properties of SiC/(SiC)1-x(AlN) x heterostructures. Proceedings of SPIE, 2011, roč. 8306, č. 8306, s. 83061K1 (83061K6 s.)ISSN: 0277- 786X.
    Detail

    DALLAEVA, D.; GERAEV, K.; BILALOV, B.; RAMAZANOV, S. Investigation of optical properties of SiC/(SiC)1-x(AlN) x heterostructures. In Photonics Prague 2011. The 7th International Conference on Photonics, Devices and Systems. Praha: Zeithamlová Milena Ing.- Agentura Action M, 2011. s. 75-76. ISBN: 978-80-86742-30- 4.
    Detail

  • 2010

    SAFARALIEV, G.; BILALOV, B.; MAGAMEDOVA, E.; SOBOLA, D.; GITIKCHIEV, M. Formations of Al2O3/ AlN structures by magnetron sputtering. In the World of Scientific Discoveries, 2010, roč. 2010, č. 4. 5, s. 23-24. ISSN: 2072- 0831.
    Detail | WWW

    BILALOV, B.; KARDASHOVA, G.; EUBOV, S.; SOBOLA, D.; GADJEV, A. Obtaining of epitaxial layers of silicon carbide and aluminum nitride solid solution by sublimation. In the World of Scientific Discoveries, 2010, roč. 2010, č. 4. 510, s. 24-25. ISSN: 2072- 0831.
    Detail | WWW

    MAGAMEDOVA, E.; BILALOV, B.; SOBOLA, D. Panoramic analysis of surface of high- resistance materials by scanning probe microscopy. In Education in nanotechnology field - modern decision and pespectives. Mocsow: 2010. s. 113-114.
    Detail

    SAFARALIEV, G.; KARDASHOVA, G.; SOBOLA, D.; MAGAMEDOVA, E. Using of AFM for investigation of high- resistance aluminum nitride films. In Fundamental problems of Radioengineering and Device Construction. Moscow: Energoatomizdat, 2010. s. 219-221. ISBN: 978-5-283-00867- 7.
    Detail

    BILALOV, B.; GITIKCHIEV, M.; MAGAMEDOVA, E.; SOBOLA, D.; BILALOV, A. Process investigation of silicon carbide ceramic obtaining by electropulse sintering. In the World of Scientific Discoveries, 2010, roč. 2010, č. 6. 1, s. 191-193. ISSN: 2072- 0831.
    Detail | WWW

    BILALOV, B.; GITIKCHIEV, M.; SOBOLA, D.; EUBOV, S. Physic-technical basis of Al2O3/ AlN structures formation by magnetron sputtering. In INTERMATIC 2010. Proceedings of the International Scientific and Technical Conference "Fundamental Problems of Radioengineering and Device Construction". Moscow: Enegroatomizdat, 2010. s. 90-93. ISBN: 978-5-283-00867- 7.
    Detail

    BILALOV, B.; GITIKCHIEV, M.; SOBOLA, D.; TAIROV, I. Features of AlN thin films formation by ion- plasma methods. In Chemistry of solid state: nanomaterials, nanotechnology. X Anniversary International scientific conference. Ruska Federace, Stavropol: Univerzita Stavropol, 2010. s. 243-245. ISBN: 5-9296-0157- 7.
    Detail

    SAFARALIEV, G.; BILALOV, B.; MAGAMEDOVA, E.; SOBOLA, D. Mathematical simulation of electropulse sintering of SiC- AlN ceramic. In the World of Scientific Discoveries, 2010, roč. 2010, č. 4, 6, s. 53-54. ISSN: 2072- 0831.
    Detail

    MAGAMEDOVA, E.; BILALOV, B.; SOBOLA, D.; EUBOV, S. Investigation of structure of ceramic targets for nanolayers synthesis by sublimation. In the World of Scientific Discoveries, 2010, roč. 2010, č. 6. 1, s. 187-188. ISSN: 2072- 0831.
    Detail

  • 2009

    SAFARALIEV, G.; BILALOV, B.; KARDASHOVA, G.; SOBOLA, D.; GITIKCHIEV, M. Obtaining of nanocrystalline aluminum nitride layers on sapphire. In 9-th International conference "Films and coatings -2009". St.- Petersburg: SPb. Izdatelstvo Polytech. univer., 2009. s. 237-239.
    Detail

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