Detail publikace

Panoramic analysis of surface of high-resistance materials by scanning probe microscopy

MAGAMEDOVA, E. BILALOV, B. SOBOLA, D.

Originální název

Panoramic analysis of surface of high-resistance materials by scanning probe microscopy

Anglický název

Panoramatická analýza povrchu vysoceodolných materiálů pomocí skenovancích sondových mikroskopů

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

ruština

Originální abstrakt

This study describes the panoramic analysis by scanning probe microscopy. It is shown that by analysis with consequent using of several methods and regimes it is possible to obtain reliable and consistent with theory data.

Anglický abstrakt

This study describes the panoramic analysis by scanning probe microscopy. It is shown that by analysis with consequent using of several methods and regimes it is possible to obtain reliable and consistent with theory data.

Klíčová slova

wide-band-gap semiconductor, probe, scanner, calibration

Klíčová slova v angličtině

wide-band-gap semiconductor, probe, scanner, calibration

Autoři

MAGAMEDOVA, E.; BILALOV, B.; SOBOLA, D.

Vydáno

18. 5. 2010

Místo

Mocsow

Strany od

113

Strany do

114

Strany počet

2

BibTex

@inproceedings{BUT76502,
  author="Egana {Magamedova} and Bilal {Bilalov} and Dinara {Sobola}",
  title="Panoramic analysis of surface of high-resistance materials by scanning probe microscopy",
  booktitle="Education in nanotechnology field -modern decision and pespectives",
  year="2010",
  pages="113--114",
  address="Mocsow"
}