Multiscale characterization of solar cells

článek ve sborníku ve WoS nebo Scopus

angličtina

The search for alternative sources of energy, including novel structures for photovoltaics, is one of the principal tasks of 21th century development. In the field of photovoltaics there are three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure details. The growing importance of novel material properties of nanostructures in scientific and industrial applications result from inhomogeneities on length scales comparable to the wavelength of light, of lattice vibrations and of electrons. Device dimensions are governed by the need to absorb light in the case of a solar cell, which dictates length scales of microns at least. Engineering aspects impose length scales above the micron scale. Due to the diversity of these structures, their complex study requires the multiscale interpretations which common core includes an integrated approach bridging not only the length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but is also applied to experimental characterization. The paper brings methods covering multiscale aspects of optical and electronic studies of these materials. We present the results of a research of the micron and sub-micron inhomogeneities in a crystalline solar cell structure utilizing scanning probe microscopy and noise measurement

Solar cell, defect, noise, multiscale, characterization

ŠKARVADA, P.; ŠKVARENINA, Ľ.; SOBOLA, D.; MACKŮ, R.; TOMÁNEK, P.; GRMELA, L.

2015

23. 11. 2015

Comenius University

Bratislava, Slovensko

978-80-223-3975-9

Progress in Applied Surface, Interface and Thin-film Science 2015

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