Detail publikace

Analysis of Color Shift on Butterfly Wings by Fourier Transform of Images from Atomic Force Microscopy

KASPAR, P. SOBOLA, D. SEDLÁK, P. HOLCMAN, V. GRMELA, L.

Originální název

Analysis of Color Shift on Butterfly Wings by Fourier Transform of Images from Atomic Force Microscopy

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Butterfly wings have complex structure lending it several interesting properties. Coloration of the wing is one of the first things to encounter and the overall visual effect is in fact influenced by several factors. Chemical pigments set the base color of the wing, topographical structures on the wing scales cause color shift by interference and their arrangement into diffraction grating causes iridescence. The thin film interference can be attributed to microscopic ridges covering wing scales. Observation and calculation of the color shift on wings of Euploea mulciber species using Fourier transform of images obtained by atomic force microscopy is the focus of this article. By using Fourier transform infrared spectroscopy it was established that both top and bottom sides of the wing of Euploea mulciber have the same chemical composition, even though they have different color. This change of color can be attributed to thin film interference, which was analyzed and calculated by using Fourier transform of images acquired by atomic force microscopy.

Klíčová slova

AFM, butterfly wing, Fourier transform, FTIR

Autoři

KASPAR, P.; SOBOLA, D.; SEDLÁK, P.; HOLCMAN, V.; GRMELA, L.

Vydáno

23. 8. 2019

Nakladatel

WILEY, 111 RIVER ST, HOBOKEN 07030-5774, NJ USA

ISSN

1097-0029

Periodikum

MICROSCOPY RESEARCH AND TECHNIQUE

Číslo

1

Stát

Spojené státy americké

Strany od

1

Strany do

7

Strany počet

7

URL

BibTex

@article{BUT158197,
  author="Pavel {Kaspar} and Dinara {Sobola} and Petr {Sedlák} and Vladimír {Holcman} and Lubomír {Grmela}",
  title="Analysis of Color Shift on Butterfly Wings by Fourier Transform of Images from Atomic Force Microscopy",
  journal="MICROSCOPY RESEARCH AND TECHNIQUE",
  year="2019",
  number="1",
  pages="1--7",
  doi="10.1002/jemt.23370",
  issn="1097-0029",
  url="https://onlinelibrary.wiley.com/doi/full/10.1002/jemt.23370"
}