Detail publikace

Characterizing SiC-AlN semiconductor solid solutions with indirect and direct bandgaps

DALLAEVA, D. RAMAZANOV, S. RAMAZANOV, G. AKHMEDOV, R. TOMÁNEK, P.

Originální název

Characterizing SiC-AlN semiconductor solid solutions with indirect and direct bandgaps

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The objective of the study is dependence of optical properties of solid solution of silicon carbide and aluminum nitride on structure. Even small differences in composition provide manipulation of band gap features in wide range. Data for this paper were collected by X-ray diffraction and by study of photoluminescence and absorption spectra. Evolution of optical properties as a result of composition changing was studied. X-ray study proves the presence of (SiC)1-x(AlN)x solid solution. Investigation of absorption spectra shows that optical band gap of the sample with composition of (SiC)0,88(AlN)0,12 is 3.1 eV and 4.24 eV for (SiC)0,36(AlN)0,64 solid solution. Photoluminescence demonstrates strongly dependence of spectrum on x concentration. The results are in mutual agrement and correspond to the therory. These data allows optimization of optical properties for certain optoelectronic application by control of the (SiC)1-x(AlN)x composition

Klíčová slova

x-ray diffraction, composition, photoluminescence, absorption coefficient, optical band gap, electron transition

Autoři

DALLAEVA, D.; RAMAZANOV, S.; RAMAZANOV, G.; AKHMEDOV, R.; TOMÁNEK, P.

Rok RIV

2015

Vydáno

6. 1. 2015

Nakladatel

SPIE

Místo

Bellingham, USA

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

9450

Číslo

9450

Stát

Spojené státy americké

Strany od

94501R-1

Strany do

94501R-6

Strany počet

6