Detail publikace

Microscopic optoelectronic defectoscopy of solar cells

ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P. DALLAEVA, D.

Originální název

Microscopic optoelectronic defectoscopy of solar cells

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by the presence of defects. If the cell works under low reverse-biased voltage, defects emit a light in visible range. The suggested method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current and thus provides more complex information. To prove its feasibility, we have selected one defect (truncated pyramid) in the sample, which emitted light under low reverse-biased voltage.

Klíčová slova

solar cell, defect, noise, topography, induced photocurrent

Autoři

ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; DALLAEVA, D.

Rok RIV

2013

Vydáno

3. 5. 2013

Nakladatel

EDP Sciences

Místo

Les Ullis, Francie

ISSN

2100-014X

Periodikum

EPJ Web of Conferences

Ročník

48

Číslo

1

Stát

Francouzská republika

Strany od

1

Strany do

4

Strany počet

4

URL

https://www.epj-conferences.org/articles/epjconf/abs/2013/09/epjconf_OAM2012_00026/epjconf_OAM2012_00026.html

Plný text v Digitální knihovně

http://hdl.handle.net/11012/193661

BibTex

@article{BUT99870,
  author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Dinara {Sobola}",
  title="Microscopic optoelectronic defectoscopy of solar cells",
  journal="EPJ Web of Conferences",
  year="2013",
  volume="48",
  number="1",
  pages="1--4",
  doi="10.1051/epjconf/20134800026",
  issn="2100-014X",
  url="https://www.epj-conferences.org/articles/epjconf/abs/2013/09/epjconf_OAM2012_00026/epjconf_OAM2012_00026.html"
}