Detail publikace

Microstructure defects in silicon solar cells

ŠKARVADA, P. KOKTAVÝ, P. SMITH, S. MACKŮ, R. ŠICNER, J. VONDRA, M. DALLAEVA, D. TOMÁNEK, P. GRMELA, L.

Originální název

Microstructure defects in silicon solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Parameters of silicon semiconductor devices are affected by the presence of defects. For the improvement of parameters and lifetime of the devices, the defect localization and characterization is important. This paper describes defects in large semiconductor devices, i.e. in crystalline silicon solar cell structure. The majority of defects has been investigated and localized using visible light emission under reversed bias measurements on microscale. Defects having impact on the sample current-voltage plot and reversed bias light emission characteristics are shown together with the micrographs of defective surface areas. Particular defects such as nonlinearity and local breakdown in current voltage plot were found in the solar cell structure. The most of the defects is associated with the surface inhomogenity but not all surface inhomogenities act as defects. Measurement at various temperatures allows identify the breakdown mechanism of the investigated defects.

Klíčová slova

solar cell, silicon, defect, inhomogeneity, breakdown, microsctructure, measurement

Autoři

ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L.

Rok RIV

2013

Vydáno

25. 11. 2013

Nakladatel

Comenius University Bratislava

Místo

Bratislava

ISBN

978-80-223-3501-0

Kniha

Proceedings of 8th Solid state surfaces and intefaces

Edice

1

Strany od

168

Strany do

169

Strany počet

2

BibTex

@inproceedings{BUT103190,
  author="Pavel {Škarvada} and Pavel {Koktavý} and Steve J. {Smith} and Robert {Macků} and Jiří {Šicner} and Marek {Vondra} and Dinara {Sobola} and Pavel {Tománek} and Lubomír {Grmela}",
  title="Microstructure defects in silicon solar cells",
  booktitle="Proceedings of 8th Solid state surfaces and intefaces",
  year="2013",
  series="1",
  pages="168--169",
  publisher="Comenius University Bratislava",
  address="Bratislava",
  isbn="978-80-223-3501-0"
}