Grantová agentura České republiky - Standardní projekty

- plně financující (2005-11-18 - 2007-12-31)

GA102/05/2095

čeština

Šikula Josef, prof. Ing. RNDr., DrSc. - hlavní řešitel

Ústav fyziky
- příjemce (18.11.2005 - nezadáno)

GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Low Frequency Noise of the CdTe Crystals. In Noise and Fluctuations. Melville, USA: American Institute of Physics, 2005. p. 175-178. ISBN: 0-7354-0267-1.
Detail

SEDLÁKOVÁ, V., ŠIKULA, J. Charge carrier transport and noise in polymer based thick films. In 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition - Proceedings. Slovinsko: MIDEM, 2006. p. 15 ( p.)ISBN: 961-91023-4-7.
Detail

HAVRÁNEK, J.; PAVELKA, J.; TOFEL, P.; ŠIKULA, J. NOISE IN SUBMICRON MOSFETS: RTS's AS THE ULTIMATE COMPONENTS OF THE 1/f NOISE. In Proceedings of 6th international conference of PhD students. Hungary, MIskolc: University of Miskolc, 2007. p. 249-253. ISBN: 978-963-661-779-0.
Detail

TACANO, M.; TANUMA, N.; PAVELKA, J.; ŠIKULA, J. Hard electronics materials, device fabrications and their noise properties. In Proc. of EDS IMAPS CS 2007. Brno: IMAPS CS, 2007. p. XV (XXIV p.)ISBN: 978-80-214-3470-7.
Detail

PAVELKA, J.; ŠIKULA, J.; TACANO, M. Non-Markov Characteristics of RTS Noise. In Proc. of EDS IMAPS CS 2007. Brno: IMAPS CS, 2007. p. 1-4. ISBN: 978-80-214-3470-7.
Detail

PAVELKA, J.; ŠIKULA, J.; TACANO, M. Non-Poisson Process in RTS-like noise. In Proc. ICNF 2007 AIP Conf. Proc. Vol. 922. Tokio: AIP, 2007. p. 111-114. ISBN: 978-0-7354-0432-8.
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ŠIKULA, J.; PAVELKA, J.; HAVRÁNEK, J.; HLÁVKA, J.; TACANO, M.; TOITA, M. RTS and 1/f Noise in Submicron MOSFETs. In Proc. ICNF 2007 AIP Conf. Proc. Vol. 922. Tokio: AIP, 2007. p. 71-74. ISBN: 978-0-7354-0432-8.
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HAVRÁNEK, J. SCALING DOWN AND LOW FREQUENCY NOISE TESTING OF SUBMICRON MOSFET'S. In Studentská soutěž a konference STUDENT EEICT 2007. Brno: VUTIUM, 2007. p. 4-8.
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ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z.; HÖSCHEL, P.; TACANO, M. Niobium Oxide and Tantalum Capacitors: Quantum Effects in Charge Carrier Transport. In Proceedings CARTS USA 2006 - The 26th Symposium for Passive Components. Orlando, Florida: Electronic Components, Assemblies and Materials Association, 2006. s. 421 ( s.)ISBN: 0-7908-0108-6.
Detail

ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z. Charge Carrier Transport in NbO and Ta Capacitors in Temperature Range 100 to 300 K. In Proceeding of CARTS Europe 2006 - 20th annual passive components symposium. Bad Homburg, Německo: Electronic Components, Assemblies and Materials Association, 2006. p. 189 ( p.)ISBN: 0-7908-0110-8.
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ŠIKULA, J.; SEDLÁKOVÁ, V.; SITA, Z. Charge Carriers Transport and Noise in Niobium Oxide and Tantalum Capacitors. In EDS '06 IMAPS CS International Conference Proceedings. Brno, ČR: Ing. Zdeněk Novotný CSc., 2006. p. 154 ( p.)ISBN: 80-214-3246-2.
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ŠIKULA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; TACANO, M.; TOITA, M. RTS Noise and quantum transitions in submicron MOSFETs. In New Trends in Physics. Brno: VUT, 2007. p. 138-141. ISBN: 978-80-7355-078-3.
Detail

PAVELKA, J.; ŠIKULA, J.; CHVÁTAL, M.; TACANO, M. RTS noise in submicron devices. In New Trends in Physics. Brno: VUT, 2007. p. 114-117. ISBN: 978-80-7355-078-3.
Detail

SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J. Noise and Electro-Ultrasonic Spectroscopy of Polymer Based Conducting Layers. In Noise and Fluctuations. USA: American Institute of Physics, 2007. p. 277-280. ISBN: 978-0-7354-0432-8.
Detail

ŠIKULA, J.; SEDLÁKOVÁ, V.; NAVAROVÁ, H.; HLÁVKA, J.; TACANO, M.; SITA, Z. Niobium Oxide and Tantalum Capacitors: Leakage Current and M-I-S Model Parameters. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies&Materials Association, 2007. p. 337-345. ISBN: 0-7908-0114-0.
Detail

SEDLÁKOVÁ, V.; ŠIKULA, J.; NAVAROVÁ, H.; PAVELKA, J.; HLÁVKA, J.; SITA, Z. Leakage Current, Noise and Reliability of NbO and Ta Capacitors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. p. 436-441.
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ŠIKULA, J.; HANDEL, P.; TRUONG, A. Quantum 1/f Noise in Bio-Chemical Resonant ZnO Sensors. In Noise and Fluctuations. USA: American Institute of Physics, 2007. p. 339-342. ISBN: 978-0-7354-0432-8.
Detail

HAVRÁNEK, J.; ŠIKULA, J.; PAVELKA, J.; GRMELA, L. RTS noise - carrier capture and emission event duration. In New trends in Physics. VUT. Brno: VUT Brno, 2007. p. 31-34. ISBN: 978-80-7355-078-3.
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HAVRÁNEK, J.; PAVELKA, J.; ŠIKULA, J.; GRMELA, L. Temperature dependence of RTS noise - trap activation energy. In New trends in physics. Brno: VUT, 2007. p. 35-38. ISBN: 978-80-7355-078-3.
Detail

CHVÁTAL, M. Zabezpečení testovacího systému s webovým rozhraním. In Elektrotechnika a informatika 2007. Západočeská univerzita v Plzni: doc. Ing. Jiří Hammerbauer, CSc., 2007. s. 25-28. ISBN: 978-80-7043-571-7.
Detail

DOBIS, P., BRÜSTLOVÁ, J.: New Trends in Physics 2007. Brno (15.11.2007)
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