Czech

Not applicable.

PhD student is offered to acquire an overview on current knowledge and contemporary methods used in the modern field of Diagnostics of nanostructures.

Knowledge on fundamentals of quantum mechanics, theory of electromagnetic field, and solid state physics is expected.

Not applicable.

Classes will have form of series of lectures, alternatively group or individual consultations.

The course is completed with discussion especially on questions associated with topics of the PhD thesis.

Not applicable.

Not applicable.

The aim of the course is to provide a survey of various methods for imaging and diagnostics of 1D and 0D nanostructures not only from the morphological and structural point of view, but also making possible to measure local electronic, optical, transport, and magnetic properties of nanostructures.

The attendance is checked.

Not applicable.

Not applicable.

A. Stroscio, W. J. Keiser: Scanning Tunneling Microscopy. Academic Press Inc., 1993. (EN)
E. Meyer, H. J. Hug: Scanning Probe Microscopy: The Lab on a Tip. Springer, 2004. (EN)
L. Novotny, B. Hecht: Principles of Nano-Optics. Cambridge University Press 2006. (EN)
L. Reimer: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer, 1998. (EN)
D. B. Williams, C. B. Carter: Transmission Electron Microscopy: A Textbook for Material Science. Springer, 2009. (EN)
P. van der Heide: X-ray Photoelectron Spectroscopy: An introduction to Principles and Practices. Wiley, 2011. (EN)
P. van der Heide: Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices. Wiley, 2014. (EN)
J. W. Rabalais: Principles and Applications of Ion Scattering Spectrometry: Surface Chemical and Structural Analysis. Wiley, 2002. (EN)

Not applicable.

20 hours, compulsory

Introduction to scanning probe microscopy (SPM); scanning tunneling microscopy (STM) – principles of imaging using tunneling current and measurement modes; scanning force microscopy (SFM) – types of forces and measurement modes; atomic force microscopy (AFM); magnetic force microscopy (MFM); electric force microscopy (EFM) and Kelvin probe force microscopy (KPFM); scanning near-field optical microscopy (SNOM); other types of SPM; principles of construction of SPM; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM, etc.); optical and spectroscopic methods (e.g. confocal scanning Raman spectroscopy and photoluminescence spectroscopy and photoluminescence); X-ray photoelectron spectroscopy (XPS); secondary ion mass spectrometry (SIMS); low energy ion scattering (LEIS); combined methods (e.g. STL, cathodoluminescence, TERS, etc.).