Course detail

The Principles of Testable Design Synthesis

FIT-PTDAcad. year: 2019/2020

The course provides the state-of-the-art coverage in the field of digital systems testing and testable design. It deals with such diagnostic problems which must be solved by a digital circuit designer.

Learning outcomes of the course unit

Not applicable.

Prerequisites

Not applicable.

Co-requisites

Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

M. Abramovici, M. A. Breuer, D. Friedman: Digital Systems Testing and Testable Design: Revised Printing, Computer Society Press, 1995, ISBN 0-7803-1062-4, 680 stran
A. L. Crouch: Design-for-Test for Digital IC's and Embedded Core Systems, Prentice Hall, 1999, ISBN 0-13-084827-1, 347 stran
P. Michel, U. Lauther, P. Duzzy: The Synthesis Approach to Digital System Design, The Kluwer International Series in Engineering and Computer Science, ISBN 0-7923-9199-3, 375 stran

Planned learning activities and teaching methods

Not applicable.

Assesment methods and criteria linked to learning outcomes

Not applicable.

Language of instruction

Czech, English

Work placements

Not applicable.

Aims

Not applicable.

Classification of course in study plans

  • Programme VTI-DR-4 Doctoral

    branch DVI4 , any year of study, winter semester, 0 credits, optional

  • Programme VTI-DR-4 Doctoral

    branch DVI4 , any year of study, winter semester, 0 credits, optional

  • Programme VTI-DR-4 Doctoral

    branch DVI4 , any year of study, winter semester, 0 credits, optional

  • Programme VTI-DR-4 Doctoral

    branch DVI4 , any year of study, winter semester, 0 credits, optional

Type of course unit

 

Lecture

39 hours, optionally

Teacher / Lecturer

Syllabus


  • The Principles of Digital System Synthesis, the Implementation of Testability Principles during the Synthesis.
  • The Testability of a Digital Circuit, Controlability and Observability Concepts, Testability Measures.
  • The Evolution of Digital Circuit Testing Methods – the Principles of Increasing Controlability/Observability Parameters of Internal Nodes.
  • Test Points Techniques. The Implementation of Scan Registers to Increase Controlability/Observability
  • Full Scan Methods: Serial Methods (LSSD, Scan Path, Scan Set), Parallel Methods (RAS, ARAS).
  • Partial Scan Methods. The Utilisation of Full and Partial Scan Methods in Synthesis.
  • PLA Testing, Testable PLA Synthesis.
  • Built-in Self Test.
  • Test Pattern Generator, Test Response Analyser.
  • BIST Architectures, Hierarchical Structure of BIST Architectures.
  • CSTP, BILBO.
  • Self-checking design.
  • Boundary Scan. Test of Connections.

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