Publication detail

Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices

DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P.

Original Title

Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices

Czech Title

Elektro-optické charakteristiky tenkovrstvých ZnS:Mn elektroluminiscenčních panelů

English Title

Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices

Type

conference paper

Language

en

Original Abstract

Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp), and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices.

Czech abstract

V článku jsou popsány lokální elektrické metody pro analýzu tenkovrstvých elektroluminiscenčních materiálů pracujících se střídavým proudem (ACTFEL):charkateristiky náboj-napětí(Q-V), kapacita-napětí(CV), vnitřní náboj-pole v luminoforu (Q-Fp) a maximální náboj-maximální použité napětí (Qmax-Vmax). Tyto metody byly použity na analýzu napařených ZnS:Mn součástek.

English abstract

Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp), and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices.

Keywords

Electroluminescence, thin film, electrical characterization, ACTFEL, ZnS

RIV year

2003

Released

09.09.2003

Publisher

Ing. Zdeněk Novotný, CSc.

Location

Brno

ISBN

80-2142452-4

Book

The 10th EDS 2003 Electronic Devices and Systems Conference

Edition

Neuveden

Edition number

Neuveden

Pages from

287

Pages to

290

Pages count

4

BibTex


@inproceedings{BUT8243,
  author="Pavel {Dobis} and Jitka {Brüstlová} and Lubomír {Grmela} and Pavel {Tománek}",
  title="Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices",
  annote="Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage    (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp), and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices.",
  address="Ing. Zdeněk Novotný, CSc.",
  booktitle="The 10th EDS 2003 Electronic Devices and Systems Conference",
  chapter="8243",
  edition="Neuveden",
  institution="Ing. Zdeněk Novotný, CSc.",
  year="2003",
  month="september",
  pages="287",
  publisher="Ing. Zdeněk Novotný, CSc.",
  type="conference paper"
}