Detail publikace

Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices

DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P.

Originální název

Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp), and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices.

Klíčová slova

Electroluminescence, thin film, electrical characterization, ACTFEL, ZnS

Autoři

DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P.

Rok RIV

2003

Vydáno

9. 9. 2003

Nakladatel

Ing. Zdeněk Novotný, CSc.

Místo

Brno

ISBN

80-2142452-4

Kniha

The 10th EDS 2003 Electronic Devices and Systems Conference

Edice

Neuveden

Číslo edice

Neuveden

Strany od

287

Strany do

290

Strany počet

4

BibTex

@inproceedings{BUT8243,
  author="Pavel {Dobis} and Jitka {Brüstlová} and Lubomír {Grmela} and Pavel {Tománek}",
  title="Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices",
  booktitle="The 10th EDS 2003 Electronic Devices and Systems Conference",
  year="2003",
  series="Neuveden",
  volume="Neuveden",
  number="Neuveden",
  pages="4",
  publisher="Ing. Zdeněk Novotný, CSc.",
  address="Brno",
  isbn="80-2142452-4"
}