Publication detail

Failure Modes of Tantalum Capacitors Made by Different Technologies

REYNOLDS, C., VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J.

Original Title

Failure Modes of Tantalum Capacitors Made by Different Technologies

Type

conference paper

Language

English

Original Abstract

Tantalum capacitor failure modes are discussed both for the standard manganese dioxide and new conducting polymer cathode types. The electrical breakdown process in normal mode and thermal breakdown in reverse mode are described, as well as self-healing phenomenon.

Key words in English

breakdown, conductive polymer, self-healing

Authors

REYNOLDS, C., VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J.

RIV year

2001

Released

1. 1. 2001

Publisher

Components Technology Institute, Inc.

Location

Huntsville, Alabama, USA

ISBN

0887-7491

Book

Proceedings of 21st Capacitor and Resistor Technology Symposium CARTS US 2001

Pages from

271

Pages to

275

Pages count

5

BibTex

@inproceedings{BUT6873,
  author="Chris {Reynolds} and Petr {Vašina} and Tomáš {Zedníček} and Josef {Šikula} and Jan {Pavelka}",
  title="Failure Modes of Tantalum Capacitors Made by Different Technologies",
  booktitle="Proceedings of 21st Capacitor and Resistor Technology Symposium CARTS US 2001",
  year="2001",
  pages="5",
  publisher="Components Technology Institute, Inc.",
  address="Huntsville, Alabama, USA",
  isbn="0887-7491"
}