Detail publikace

Failure Modes of Tantalum Capacitors Made by Different Technologies

REYNOLDS, C., VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J.

Originální název

Failure Modes of Tantalum Capacitors Made by Different Technologies

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Tantalum capacitor failure modes are discussed both for the standard manganese dioxide and new conducting polymer cathode types. The electrical breakdown process in normal mode and thermal breakdown in reverse mode are described, as well as self-healing phenomenon.

Klíčová slova v angličtině

breakdown, conductive polymer, self-healing

Autoři

REYNOLDS, C., VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J.

Rok RIV

2001

Vydáno

1. 1. 2001

Nakladatel

Components Technology Institute, Inc.

Místo

Huntsville, Alabama, USA

ISBN

0887-7491

Kniha

Proceedings of 21st Capacitor and Resistor Technology Symposium CARTS US 2001

Strany od

271

Strany do

275

Strany počet

5

BibTex

@inproceedings{BUT6873,
  author="Chris {Reynolds} and Petr {Vašina} and Tomáš {Zedníček} and Josef {Šikula} and Jan {Pavelka}",
  title="Failure Modes of Tantalum Capacitors Made by Different Technologies",
  booktitle="Proceedings of 21st Capacitor and Resistor Technology Symposium CARTS US 2001",
  year="2001",
  pages="5",
  publisher="Components Technology Institute, Inc.",
  address="Huntsville, Alabama, USA",
  isbn="0887-7491"
}