Publication detail

Dynamické testování solárních článků.

J.Boušek

Original Title

Dynamické testování solárních článků.

English Title

Dynamic testing of solar cells

Type

conference paper

Language

Czech

Original Abstract

Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.

Keywords

solar cells, reverse breakdown voltage, minority carrier lifetime, recombination, diffusion capacitance

Authors

J.Boušek

RIV year

2005

Released

15. 12. 2005

Publisher

Nakl. Novotný

Location

Brno

ISBN

80-214-3116-4

Book

Mikrosyn. Nové trendy v mikroelektronických systémech a nanotechnologiích. Sborník seminare

Pages from

168

Pages to

173

Pages count

6

BibTex

@inproceedings{BUT20900,
  author="Jaroslav {Boušek}",
  title="Dynamické testování solárních článků.",
  booktitle="Mikrosyn. Nové trendy v mikroelektronických systémech a nanotechnologiích. Sborník seminare",
  year="2005",
  pages="6",
  publisher="Nakl. Novotný",
  address="Brno",
  isbn="80-214-3116-4"
}