Publication detail

Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution

ZEMEK, M. ŠALPLACHTA, J. MÉZL, M.

Original Title

Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

Computed tomography allows for nondestructive evaluation of samples. It is commonly used for many industrial and scientific applications. Some devices are capable of submicron resolutions, but this often comes at the cost of a limited field of view. Techniques that extend the field of view can greatly enhance the versatility of these scanners. One such technique is presented here. It is implemented on the Rigaku Nano3DX, almost doubling its lateral field of view. The method utilizes a standard reconstruction algorithm, and yields faithful reconstructions of scanned samples without the need for a larger detector.

Keywords

X-ray, computed tomography, field-of-view extension, offset scan

Authors

ZEMEK, M.; ŠALPLACHTA, J.; MÉZL, M.

Released

26. 6. 2020

Publisher

Brno University of Technology, Faculty of Electrical Engineering and

Location

Brno

ISBN

978-80-214-5868-0

Book

Proceedings II of the 26th Conference STUDENT EEICT 2020

Edition

1st

Pages from

64

Pages to

67

Pages count

4

URL

https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_2.pdf

BibTex

@inproceedings{BUT165695,
  author="Marek {Zemek} and Jakub {Šalplachta} and Martin {Mézl}",
  title="Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution",
  booktitle="Proceedings II of the 26th Conference STUDENT EEICT 2020",
  year="2020",
  series="1st",
  pages="64--67",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and",
  address="Brno",
  isbn="978-80-214-5868-0",
  url="https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_2.pdf"
}