Detail publikace

Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution

ZEMEK, M. ŠALPLACHTA, J. MÉZL, M.

Originální název

Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

Computed tomography allows for nondestructive evaluation of samples. It is commonly used for many industrial and scientific applications. Some devices are capable of submicron resolutions, but this often comes at the cost of a limited field of view. Techniques that extend the field of view can greatly enhance the versatility of these scanners. One such technique is presented here. It is implemented on the Rigaku Nano3DX, almost doubling its lateral field of view. The method utilizes a standard reconstruction algorithm, and yields faithful reconstructions of scanned samples without the need for a larger detector.

Klíčová slova

X-ray, computed tomography, field-of-view extension, offset scan

Autoři

ZEMEK, M.; ŠALPLACHTA, J.; MÉZL, M.

Vydáno

26. 6. 2020

Nakladatel

Brno University of Technology, Faculty of Electrical Engineering and

Místo

Brno

ISBN

978-80-214-5868-0

Kniha

Proceedings II of the 26th Conference STUDENT EEICT 2020

Edice

1st

Strany od

64

Strany do

67

Strany počet

4

URL

https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_2.pdf

BibTex

@inproceedings{BUT165695,
  author="Marek {Zemek} and Jakub {Šalplachta} and Martin {Mézl}",
  title="Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution",
  booktitle="Proceedings II of the 26th Conference STUDENT EEICT 2020",
  year="2020",
  series="1st",
  pages="64--67",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and",
  address="Brno",
  isbn="978-80-214-5868-0",
  url="https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_2.pdf"
}