Publication detail

Microcode-controlled RAM BIST

VYKYDAL, L.

Original Title

Microcode-controlled RAM BIST

English Title

Microcode-controlled RAM BIST

Type

conference paper

Language

Czech

Original Abstract

This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.

English abstract

This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.

Keywords

memory testing, March algorithms, memory BIST, counters

Key words in English

memory testing, March algorithms, memory BIST, counters

Authors

VYKYDAL, L.

Released

27. 4. 2017

ISBN

978-80-214-5496-5

Book

Proceedings of the 23rd Conference STUDENT EEICT2017

Pages from

236

Pages to

238

Pages count

3

URL

http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf

BibTex

@inproceedings{BUT139560,
  author="Lukáš {Vykydal}",
  title="Microcode-controlled RAM BIST",
  booktitle="Proceedings of the 23rd Conference STUDENT EEICT2017",
  year="2017",
  pages="236--238",
  isbn="978-80-214-5496-5",
  url="http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf"
}