Detail publikace

Microcode-controlled RAM BIST

VYKYDAL, L.

Originální název

Microcode-controlled RAM BIST

Anglický název

Microcode-controlled RAM BIST

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

čeština

Originální abstrakt

This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.

Anglický abstrakt

This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.

Klíčová slova

memory testing, March algorithms, memory BIST, counters

Klíčová slova v angličtině

memory testing, March algorithms, memory BIST, counters

Autoři

VYKYDAL, L.

Vydáno

27. 4. 2017

ISBN

978-80-214-5496-5

Kniha

Proceedings of the 23rd Conference STUDENT EEICT2017

Strany od

236

Strany do

238

Strany počet

3

URL

http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf

BibTex

@inproceedings{BUT139560,
  author="Lukáš {Vykydal}",
  title="Microcode-controlled RAM BIST",
  booktitle="Proceedings of the 23rd Conference STUDENT EEICT2017",
  year="2017",
  pages="236--238",
  isbn="978-80-214-5496-5",
  url="http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf"
}