Detail publikace

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

Originální název

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

Anglický název

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

Jazyk

en

Originální abstrakt

The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.

Anglický abstrakt

The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.

BibTex


@inproceedings{BUT6857,
  author="Vlasta {Sedláková} and Jan {Pavelka} and Josef {Šikula} and Dubravka {Ročak} and Marko {Hrovat} and Darko {Belavič}",
  title="Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators",
  annote="The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.",
  address="World Scientific",
  booktitle="Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001",
  chapter="6857",
  institution="World Scientific",
  year="2001",
  month="january",
  pages="747",
  publisher="World Scientific",
  type="conference paper"
}