Detail publikace

Low Frequency Noise of Tantalum Capacitors

Originální název

Low Frequency Noise of Tantalum Capacitors

Anglický název

Low Frequency Noise of Tantalum Capacitors

Jazyk

en

Originální abstrakt

A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum capcitors in order to characterise their quality and reliabilityThe moedl of ta - ta2O5 - MnO2 MIS structure was used to give physical interpretation of VA characteristic noth in normal and reverse modes. The self-healing process based on high temperature MnO2- Mn2O3 transformation was studied and its kinetic determined on the basis of noise spectral density changes.

Anglický abstrakt

A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum capcitors in order to characterise their quality and reliabilityThe moedl of ta - ta2O5 - MnO2 MIS structure was used to give physical interpretation of VA characteristic noth in normal and reverse modes. The self-healing process based on high temperature MnO2- Mn2O3 transformation was studied and its kinetic determined on the basis of noise spectral density changes.

BibTex


@inproceedings{BUT6837,
  author="Josef {Šikula} and Jan {Hlávka} and Jan {Pavelka} and Vlasta {Sedláková} and Lubomír {Grmela} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="Low Frequency Noise of Tantalum Capacitors",
  annote="A low frequency noise and charge carriers transport mechanism analysis was performed on tantalum capcitors in order to characterise their quality and reliabilityThe moedl of ta - ta2O5 - MnO2 MIS structure was used to give physical interpretation of VA characteristic noth in normal and reverse modes. The self-healing process based on high temperature MnO2- Mn2O3 transformation was studied and its kinetic determined on the basis of noise spectral density changes.",
  address="Electronic Components Institute Internationale Ltd.",
  booktitle="Proceedings of CARTS-Euro 2001",
  chapter="6837",
  institution="Electronic Components Institute Internationale Ltd.",
  year="2001",
  month="january",
  pages="81",
  publisher="Electronic Components Institute Internationale Ltd.",
  type="conference paper"
}