Detail publikace

Oriented Thin Films of Polysilylenes and their Properties

Originální název

Oriented Thin Films of Polysilylenes and their Properties

Anglický název

Oriented Thin Films of Polysilylenes and their Properties

Jazyk

en

Originální abstrakt

Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.

Anglický abstrakt

Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.

BibTex


@inproceedings{BUT2876,
  author="Ota {Salyk} and Ivo {Kuřitka} and Martin {Weiter} and František {Schauer}",
  title="Oriented Thin Films of Polysilylenes and their Properties",
  annote="Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method.  Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence,  and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered,  firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.",
  address="Brno University of Technology, Faculty of Chemistry",
  booktitle="Proceedings of the Workshop Electronic Properties of Molecular Materials and Functional Polymers of EU programme COST 518 Molecular Materials and Functional Polymers for Advanced Devices",
  chapter="2876",
  institution="Brno University of Technology, Faculty of Chemistry",
  year="2001",
  month="january",
  pages="168",
  publisher="Brno University of Technology, Faculty of Chemistry",
  type="conference paper"
}