Detail publikace

DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL

Originální název

DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL

Anglický název

DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL

Jazyk

en

Originální abstrakt

This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison.

Anglický abstrakt

This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison.

BibTex


@inproceedings{BUT27451,
  author="Kristýna {Jandová} and Jiří {Vaněk} and Radim {Bařinka}",
  title="DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL",
  annote="This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison.",
  booktitle="23rd European Photovoltaic Solar Energy Conference, 1-5 September 2008, Valencia, Spain",
  chapter="27451",
  howpublished="print",
  year="2008",
  month="november",
  pages="458--460",
  type="conference paper"
}