Detail publikace

Modern TFT sensor measurement method

Originální název

Modern TFT sensor measurement method

Anglický název

Modern TFT sensor measurement method

Jazyk

en

Originální abstrakt

This paper focuses to modern TFT sensors measurement method. This method used new design of a monolithic ASIC for measurement TFT sensor. The sensor applies alumina substrate prepared by thick film technology. The ASIC prototype in CMOS 0.7 µm technology contains analog measurement block and programmable digital calibration EPROM memory on one chip.

Anglický abstrakt

This paper focuses to modern TFT sensors measurement method. This method used new design of a monolithic ASIC for measurement TFT sensor. The sensor applies alumina substrate prepared by thick film technology. The ASIC prototype in CMOS 0.7 µm technology contains analog measurement block and programmable digital calibration EPROM memory on one chip.

BibTex


@inproceedings{BUT15854,
  author="Pavel {Šteffan} and Lukáš {Fujcik} and Radimír {Vrba} and Roman {Prokop}",
  title="Modern TFT sensor measurement method",
  annote="This paper focuses to modern TFT sensors measurement method. This method used
new design of a monolithic ASIC for measurement TFT sensor. The sensor applies
alumina substrate prepared by thick film technology. The ASIC prototype in CMOS 0.7
µm technology contains analog measurement block and programmable digital
calibration EPROM memory on one chip.",
  address="Nakl. Novotny",
  booktitle="Moderní metody řešení, návrhu a aplikace elektronických obvodů",
  chapter="15854",
  institution="Nakl. Novotny",
  year="2005",
  month="october",
  pages="71",
  publisher="Nakl. Novotny",
  type="conference paper"
}