Detail publikace

Comparison of Point Similarity Measures for Atlas-based Registration of MRI Brain Images

Originální název

Comparison of Point Similarity Measures for Atlas-based Registration of MRI Brain Images

Anglický název

Comparison of Point Similarity Measures for Atlas-based Registration of MRI Brain Images

Jazyk

en

Originální abstrakt

High-dimensional deformable registration of MRI brain images is presented here. The deformation is driven by local forces estimated from point similarities based on joint histogram and with the use of prior information obtained from tissue probability maps available in selected commonly used brain atlases. Three point similarity measures are tested in an experiment with data obtained from standard Simulated Brain Database.

Anglický abstrakt

High-dimensional deformable registration of MRI brain images is presented here. The deformation is driven by local forces estimated from point similarities based on joint histogram and with the use of prior information obtained from tissue probability maps available in selected commonly used brain atlases. Three point similarity measures are tested in an experiment with data obtained from standard Simulated Brain Database.

BibTex


@inproceedings{BUT14462,
  author="Daniel {Schwarz} and Ivo {Provazník}",
  title="Comparison of Point Similarity Measures for Atlas-based Registration of MRI Brain Images",
  annote="High-dimensional deformable registration of MRI brain images is presented here. The deformation is driven by local forces estimated from point similarities based on joint histogram and with the use of prior information obtained from tissue probability maps available in selected commonly used brain atlases. Three point similarity measures are tested in an experiment with data obtained from standard Simulated Brain Database.",
  address="IEEE",
  booktitle="Proceedings of 27th Annual IEEE EMBS International Conference",
  chapter="14462",
  institution="IEEE",
  year="2005",
  month="september",
  pages="455",
  publisher="IEEE",
  type="conference paper"
}