Detail publikace

Nested Loops Degree Impact on RTL Digital Circuit Testability

STRNADEL, J.

Originální název

Nested Loops Degree Impact on RTL Digital Circuit Testability

Anglický název

Nested Loops Degree Impact on RTL Digital Circuit Testability

Jazyk

en

Originální abstrakt

The existence of loops in a circuit structure causes problems in both test generation and application. Thus, the problem of identifying loops becomes an important task during testability analysis or, later, e.g., during allocation-for testability process. When nested loops occur in the circuit, it is necessary to accurately determine the most nested one to improve circuit testability significantly, with minimal design cost. This paper deals with the problem of identifying nested loops including their nesting degree in the register-transfer level (RTL) digital circuit structure as well as with the impact of such loops on the circuit testability.

Anglický abstrakt

The existence of loops in a circuit structure causes problems in both test generation and application. Thus, the problem of identifying loops becomes an important task during testability analysis or, later, e.g., during allocation-for testability process. When nested loops occur in the circuit, it is necessary to accurately determine the most nested one to improve circuit testability significantly, with minimal design cost. This paper deals with the problem of identifying nested loops including their nesting degree in the register-transfer level (RTL) digital circuit structure as well as with the impact of such loops on the circuit testability.

Dokumenty

BibTex


@inproceedings{BUT13789,
  author="Josef {Strnadel}",
  title="Nested Loops Degree Impact on RTL Digital Circuit Testability",
  annote="The existence of loops in a circuit structure causes problems in both test generation and application. Thus, the problem of identifying loops becomes an important task during testability analysis or, later, e.g., during allocation-for testability process. When nested loops occur in the circuit, it is necessary to accurately determine the most nested one to improve circuit testability significantly, with minimal design cost. This paper deals with the problem of identifying nested loops including their nesting degree in the register-transfer level (RTL) digital circuit structure as well as with the impact of such loops on the circuit testability.",
  address="Elsevier Science",
  booktitle="Programmable Devices and Systems",
  chapter="13789",
  institution="Elsevier Science",
  year="2003",
  month="february",
  pages="202--207",
  publisher="Elsevier Science",
  type="conference paper"
}