Publication detail

Nested Loops Degree Impact on RTL Digital Circuit Testability

STRNADEL, J.

Original Title

Nested Loops Degree Impact on RTL Digital Circuit Testability

Type

conference paper

Language

English

Original Abstract

The existence of loops in a circuit structure causes problems in both test generation and application. Thus, the problem of identifying loops becomes an important task during testability analysis or, later, e.g., during allocation-for testability process. When nested loops occur in the circuit, it is necessary to accurately determine the most nested one to improve circuit testability significantly, with minimal design cost. This paper deals with the problem of identifying nested loops including their nesting degree in the register-transfer level (RTL) digital circuit structure as well as with the impact of such loops on the circuit testability.

Keywords

Testability, feedback loop, directed graph, ordered set, graph algorithm

Authors

STRNADEL, J.

RIV year

2003

Released

11. 2. 2003

Publisher

Elsevier Science

Location

Oxford

ISBN

0-08-044130-0

Book

Programmable Devices and Systems

Pages from

202

Pages to

207

Pages count

6

URL

http://www.fit.vutbr.cz/~strnadel/publ/2003/pds/strnadel.pdf

BibTex

@inproceedings{BUT13789,
  author="Josef {Strnadel}",
  title="Nested Loops Degree Impact on RTL Digital Circuit Testability",
  booktitle="Programmable Devices and Systems",
  year="2003",
  pages="202--207",
  publisher="Elsevier Science",
  address="Oxford",
  isbn="0-08-044130-0",
  url="http://www.fit.vutbr.cz/~strnadel/publ/2003/pds/strnadel.pdf"
}