Detail publikace

Thermographic Control of Organic Solar Cells

Originální název

Thermographic Control of Organic Solar Cells

Anglický název

Thermographic Control of Organic Solar Cells

Jazyk

en

Originální abstrakt

This paper presents the results from research on the application of Infrared Thermography (IRT) for sub-surface defect evaluation in organic solar cells. An identification of sub-surface defects, connected with the inhomogeneity of the active film thickness, dislocation of the masks during the sample preparation, leakage currents between neighbor electrodes, and structural defects was carried out. The results show a successful application of IRT for fault detection and localization during fabrication process and during the diagnostic control of such modules.

Anglický abstrakt

This paper presents the results from research on the application of Infrared Thermography (IRT) for sub-surface defect evaluation in organic solar cells. An identification of sub-surface defects, connected with the inhomogeneity of the active film thickness, dislocation of the masks during the sample preparation, leakage currents between neighbor electrodes, and structural defects was carried out. The results show a successful application of IRT for fault detection and localization during fabrication process and during the diagnostic control of such modules.

BibTex


@inproceedings{BUT111904,
  author="Ivaylo {Zhivkov} and Jana {Vrchotová} and Martin {Weiter}",
  title="Thermographic Control of Organic Solar Cells",
  annote="This paper presents the results from research on the application of Infrared Thermography (IRT) for sub-surface defect evaluation in organic solar cells. An identification of sub-surface defects, connected with the inhomogeneity of the active film thickness, dislocation of the masks during the sample preparation, leakage currents between neighbor electrodes, and structural defects was carried out. The results show a successful application of IRT for fault detection and localization during fabrication process and during the diagnostic control of such modules.",
  booktitle="37th International Spring Seminar on Electronics Technology (ISSE), 2014",
  chapter="111904",
  doi="10.1109/ISSE.2014.6887606",
  howpublished="print",
  year="2014",
  month="may",
  pages="267--272",
  type="conference paper"
}