Detail publikace

Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

STRNADEL, J., KOTÁSEK, Z.

Originální název

Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.

Klíčová slova

design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm

Autoři

STRNADEL, J., KOTÁSEK, Z.

Rok RIV

2002

Vydáno

1. 9. 2002

Nakladatel

IEEE Computer Society Press

Místo

Los Alamitos

ISBN

0-7695-1790-0

Kniha

Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002

Strany od

166

Strany do

173

Strany počet

8

URL

http://www.fit.vutbr.cz/~strnadel/publ/2002/dsd/8pages.pdf

BibTex

@inproceedings{BUT10243,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level",
  booktitle="Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002",
  year="2002",
  pages="166--173",
  publisher="IEEE Computer Society Press",
  address="Los Alamitos",
  isbn="0-7695-1790-0",
  url="http://www.fit.vutbr.cz/~strnadel/publ/2002/dsd/8pages.pdf"
}