Detail publikace
Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
STRNADEL, J., KOTÁSEK, Z.
Originální název
Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
Anglický název
Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
Jazyk
en
Originální abstrakt
The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.
Anglický abstrakt
The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.
Dokumenty
BibTex
@inproceedings{BUT10010,
author="Josef {Strnadel} and Zdeněk {Kotásek}",
title="Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
annote="The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.",
booktitle="Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
chapter="10010",
edition="Vol. I.",
year="2002",
month="april",
pages="297--304",
type="conference paper"
}