Detail publikace
Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
STRNADEL, J. KOTÁSEK, Z.
Originální název
Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
Typ
článek ve sborníku mimo WoS a Scopus
Jazyk
angličtina
Originální abstrakt
The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.
Klíčová slova
Register-transfer level, controllability, observability, testability, testability analysis
Autoři
STRNADEL, J.; KOTÁSEK, Z.
Rok RIV
2002
Vydáno
29. 4. 2002
Nakladatel
Marq software s.r.o.
Místo
Ostrava
ISBN
80-85988-71-2
Kniha
Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems
Edice
Vol. I.
Strany od
297
Strany do
304
Strany počet
8
URL
BibTex
@inproceedings{BUT10010,
author="Josef {Strnadel} and Zdeněk {Kotásek}",
title="Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
booktitle="Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
year="2002",
series="Vol. I.",
pages="297--304",
publisher="Marq software s.r.o.",
address="Ostrava",
isbn="80-85988-71-2",
url="https://www.fit.vut.cz/research/publication/6917/"
}
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