Detail publikace

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

STRNADEL, J., KOTÁSEK, Z.

Originální název

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

Anglický název

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

Jazyk

en

Originální abstrakt

The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.

Anglický abstrakt

The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.

Dokumenty

BibTex 


@inproceedings{BUT10010,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
  annote="The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.",
  booktitle="Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
  chapter="10010",
  edition="Vol. I.",
  year="2002",
  month="april",
  pages="297--304",
  type="conference paper"
}