Detail publikace

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

Originální název

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

Anglický název

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

Jazyk

en

Originální abstrakt

The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.

Anglický abstrakt

The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.

BibTex


@article{BUT49824,
  author="Lubomír {Grmela} and Pavel {Škarvada} and Pavel {Tománek} and Robert {Macků} and Steve J. {Smith}",
  title="Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells",
  annote="The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the
emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.",
  address="Elsevier",
  chapter="49824",
  institution="Elsevier",
  number="1",
  volume="96",
  year="2012",
  month="january",
  pages="108--111",
  publisher="Elsevier",
  type="journal article in Web of Science"
}