Detail publikace

Low frequency noise in submicron MOSFETs

PAVELKA, J., ŠIKULA, J., TACANO, M.

Originální název

Low frequency noise in submicron MOSFETs

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Low frequency noise of Si N-MOSFET and GaN/Al/GaN HFET devices was mesured down to microHz region, given by 1/f noise and RTS noise components. RTS noise voltage signal was analysed by means of zero cross method.

Klíčová slova v angličtině

MOSFET, RTS noise, 1/f noise

Autoři

PAVELKA, J., ŠIKULA, J., TACANO, M.

Rok RIV

2006

Vydáno

1. 1. 2006

Nakladatel

IMAPS CS

Místo

Brno

ISBN

80-214-3246-2

Kniha

Proceedings of IMAPS CS International Conference Electronic Devices and Systems 2006

Strany od

148

Strany do

153

Strany počet

6

BibTex

@inproceedings{BUT25042,
  author="Jan {Pavelka} and Josef {Šikula} and Munecazu {Tacano}",
  title="Low frequency noise in submicron MOSFETs",
  booktitle="Proceedings of IMAPS CS International Conference Electronic Devices and Systems 2006",
  year="2006",
  pages="6",
  publisher="IMAPS CS",
  address="Brno",
  isbn="80-214-3246-2"
}