Detail publikace

Molybdenum diselenide thin films grown by atomic layer deposition: An XPS analysis

RODRIGUEZ PEREIRA, J. ZAZPE, R. CHARVOT, J. BUREŠ, F. MACÁK, J.

Originální název

Molybdenum diselenide thin films grown by atomic layer deposition: An XPS analysis

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Molybdenum diselenide (MoSe2) thin films were deposited on annealed titanium foils by atomic layer deposition using suitable precursors. In this paper, a detailed x-ray photoelectron spectroscopy analysis of the MoSe2 film is presented. Survey spectra, Mo 3d, Se 3d, Mo 3p, Se LMM, Se 3p, C 1s, and Se 4s core level along with the valence band spectra were measured. Quantitative analysis indicates a surface composition of MoSe1.8, suggesting a deficiency of selenium on the surface.

Klíčová slova

MoSe2; transition metal dichalcogenides; thin films; 2D material; XPS

Autoři

RODRIGUEZ PEREIRA, J.; ZAZPE, R.; CHARVOT, J.; BUREŠ, F.; MACÁK, J.

Vydáno

1. 12. 2020

Nakladatel

AMER INST PHYSICS

Místo

MELVILLE

ISSN

1055-5269

Periodikum

Surface Science Spectra

Ročník

27

Číslo

2

Stát

Spojené státy americké

Strany od

024006-1

Strany do

024006-8

Strany počet

8

URL

https://avs.scitation.org/doi/10.1116/6.0000354