Detail publikace

SPM methods for nanotechnology

Jaroslav Kala

Originální název

SPM methods for nanotechnology

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are also presented

Klíčová slova

SPM, STM, SNOM, nanotechnology

Autoři

Jaroslav Kala

Rok RIV

2005

Vydáno

14. 8. 2005

Nakladatel

University of Miskolc, Hungary

ISBN

9636616735

Kniha

5th INTERNATIONAL CONFERENCE OF PHD STUDENTS

Edice

1

Číslo edice

1

Strany od

79

Strany do

84

Strany počet

6

BibTex

@inproceedings{BUT14972,
  author="Jaroslav {Kala}",
  title="SPM methods for nanotechnology",
  booktitle="5th INTERNATIONAL CONFERENCE OF PHD STUDENTS",
  year="2005",
  series="1",
  volume="1",
  number="1",
  pages="6",
  publisher="University of Miskolc, Hungary",
  isbn="9636616735"
}